Dr. Frederick M. Waltz
Consultant at
SPIE Involvement:
Conference Chair | Track Chair | Author
Publications (46)

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Clocks, Detection and tracking algorithms, Sensors, Image processing, Inspection, Linear filtering, Machine vision, Convolution, Nonlinear filtering, Bandpass filters

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Clocks, Spatial frequencies, Matrices, Inspection, Computing systems, Image quality, Machine vision, Fractal analysis, Raster graphics, Electrochemical etching

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
KEYWORDS: Clocks, Sensors, Image processing, Digital filtering, Computing systems, Control systems, Gaussian filters, Image filtering, Convolution, Binary data

PROCEEDINGS ARTICLE | February 11, 2002
Proc. SPIE. 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
KEYWORDS: Diamond, Logic, Image processing, Inspection, Combustion, Computing systems, Distance measurement, Mathematics, Selenium, Binary data

PROCEEDINGS ARTICLE | February 11, 2002
Proc. SPIE. 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II
KEYWORDS: Logic, Image processing, Computing systems, Image analysis, Optical inspection, Image quality, Mathematics, Tolerancing, Binary data, Electrochemical etching

PROCEEDINGS ARTICLE | February 12, 2001
Proc. SPIE. 4189, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
KEYWORDS: Image processing, Inspection, Computing systems, Image analysis, Optical inspection, Image quality, Convolution, Operating systems, Binary data, Electrochemical etching

Showing 5 of 46 publications
Conference Committee Involvement (8)
Machine Vision Applications, Architectures, and Systems Integration V
18 November 1996 | Boston, MA, United States
Machine Vision Applications, Architectures and Systems Integration IV
23 October 1995 | Philadelphia, PA, United States
Machine Vision Applications, Architectures, and Systems Integration III
31 October 1994 | Boston, MA, United States
Machine Vision Applications, Architectures, and Systems Integration II
7 September 1993 | Boston, MA, United States
Machine Vision Applications, Architectures, and Systems Integration
17 November 1992 | Boston, MA, United States
Showing 5 of 8 published special sections
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