The study investigates a new platform of PFAS-free PAGs and evaluates their lithographic efficiency in comparison to PFAS-containing counterparts in multiple model photoresists, including both negative and positive tones, across a broad range of optical exposure wavelengths. PFAS-free photoresists materials demonstrate comparable / superior lithographic performance in resolution, depth-of-focus (DOF), and exposure latitude (EL) compared with their non-degradable counterparts.
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