Prof. Tilo Pfeifer
at RWTH Aachen Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (25)

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Optical components, Metrology, Optical spheres, Interferometers, Calibration, Error analysis, Interferometry, Virtual reality, Standards development, Phase shifts

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Mirrors, Phase shifting, Optical spheres, Interferometers, Error analysis, Interferometry, Wavefronts, Phase measurement, Optimization (mathematics), Model-based design

PROCEEDINGS ARTICLE | July 1, 2005
Proc. SPIE. 5836, Smart Sensors, Actuators, and MEMS II
KEYWORDS: Microelectromechanical systems, Confocal microscopy, Microscopes, Beam splitters, Metrology, Image processing, Atomic force microscopy, Objectives, Computer aided design, Nanoelectromechanical systems

PROCEEDINGS ARTICLE | February 14, 2005
Proc. SPIE. 5776, Eighth International Symposium on Laser Metrology
KEYWORDS: Fringe analysis, 3D acquisition, Cameras, Sensors, Image processing, CCD cameras, Projection systems, Image transmission, Computer aided design, 3D image processing

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Metrology, Optical sensors, Sensors, Inspection, Laser welding, Data acquisition, Optical metrology, Computer aided design, Product engineering, Standards development

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Metrology, Visualization, Imaging systems, Cameras, Calibration, Inspection, Control systems, Computer programming, Optical inspection, Robotic systems

Showing 5 of 25 publications
Conference Committee Involvement (3)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection III
23 June 2003 | Munich, Germany
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