Dr. Wei Chu
at National Institute of Standards and Technology
SPIE Involvement:
Publications (6)

Proceedings Article | 10 June 2010 Paper
T. Vorburger, J. Song, W. Chu, T. Renegar, A. Zheng, J. Yen, R. Thompson, R. Silver, B. Bachrach, M. Ols
Proceedings Volume 7729, 77291D (2010) https://doi.org/10.1117/12.859918
KEYWORDS: Standards development, Objectives, Confocal microscopy, Firearms, Microscopes, Optical imaging, Image acquisition, Optical microscopes, Databases, Imaging systems

Proceedings Article | 3 June 2010 Paper
Wei Chu, John Song, Theodore Vorburger, Robert Thompson, Thomas Renegar, Richard Silver
Proceedings Volume 7729, 77291C (2010) https://doi.org/10.1117/12.859858
KEYWORDS: Edge detection, Image processing, System identification, Firearms, Binary data, Microscopes, Manufacturing, Forensic science, Image compression, Sensors

Proceedings Article | 5 April 2007 Paper
Yueyu Wang, Xuezeng Zhao, Wei Chu
Proceedings Volume 6518, 65184J (2007) https://doi.org/10.1117/12.711851
KEYWORDS: Actuators, Scanning probe microscopy, Scanners, Data modeling, Sensors, Systems modeling, Statistical modeling, Scanning probe microscopes, Distortion, Scanning tunneling microscopy

Proceedings Article | 23 February 2006 Paper
Hong-bo Li, Xue-zheng Zhao, Wei Chu, Ning Li
Proceedings Volume 6150, 61504S (2006) https://doi.org/10.1117/12.676727
KEYWORDS: Line edge roughness, Line width roughness, Neural networks, Atomic force microscopy, Edge detection, Image processing, Lithium, Data processing, Edge roughness, Binary data

Proceedings Article | 20 August 2004 Paper
Wei Chu, Xuezeng Zhao, Joseph Fu, Theodore Vorburger
Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557767
KEYWORDS: Image registration, Atomic force microscopy, Carbon nanotubes, Distortion, Image fusion, 3D image processing, Standards development, Error analysis, Metrology, Electrical engineering

Showing 5 of 6 publications
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