Dr. William J. Parrish
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Author
Publications (17)

PROCEEDINGS ARTICLE | June 8, 2015
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Packaging, Microbolometers, Accelerated life testing, Semiconductors, Electronics, Cameras, Sensors, Manufacturing, Semiconducting wafers, Thermal weapon sites

PROCEEDINGS ARTICLE | August 30, 2004
Proc. SPIE. 5406, Infrared Technology and Applications XXX
KEYWORDS: Staring arrays, Bolometers, Packaging, Readout integrated circuits, Microbolometers, Electronics, Cameras, Multiplexers, Forward looking infrared, Semiconducting wafers

PROCEEDINGS ARTICLE | October 10, 2003
Proc. SPIE. 5074, Infrared Technology and Applications XXIX
KEYWORDS: Bolometers, Readout integrated circuits, Microbolometers, Metrology, Cameras, Metals, Silicon, Process control, Reactive ion etching, Semiconducting wafers

PROCEEDINGS ARTICLE | July 21, 2000
Proc. SPIE. 4040, Unattended Ground Sensor Technologies and Applications II
KEYWORDS: Staring arrays, Bolometers, Readout integrated circuits, Patents, Imaging systems, Cameras, Sensors, Video, Field effect transistors, Temperature metrology

PROCEEDINGS ARTICLE | July 12, 2000
Proc. SPIE. 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
KEYWORDS: Mid-IR, Reticles, Electronics, Imaging systems, Silicon, Control systems, Infrared radiation, Semiconducting wafers, Digital electronics, Temperature metrology

PROCEEDINGS ARTICLE | July 30, 1999
Proc. SPIE. 3713, Unattended Ground Sensor Technologies and Applications
KEYWORDS: Staring arrays, Infrared cameras, Patents, Imaging systems, Cameras, Sensors, Video, Field programmable gate arrays, Image quality, Integration

Showing 5 of 17 publications
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