Wojciech Lipke
Software Developer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2022 Presentation + Paper
Proceedings Volume 12223, 122230G (2022) https://doi.org/10.1117/12.2636220
KEYWORDS: Tomography, Interferometry, Diffraction, Microscopes, Diffraction gratings, Microscopy, Reconstruction algorithms, Fringe analysis, Imaging systems, 3D image processing

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