PROCEEDINGS VOLUME 0802
FOURTH INTERNATIONAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING | 30 MARCH - 3 APRIL 1987
In-Process Optical Metrology for Precision Machining
IN THIS VOLUME

0 Sessions, 28 Papers, 0 Presentations
All Papers  (28)
FOURTH INTERNATIONAL SYMPOSIUM ON OPTICAL AND OPTOELECTRONIC APPLIED SCIENCES AND ENGINEERING
30 March - 3 April 1987
The Hague, Netherlands
All Papers
Proc. SPIE 0802, Mass-Production Of Diffraction Limited Replicated Objective Lenses For Compact-Disc Players., 0000 (1 January 1987); doi: 10.1117/12.967096
Proc. SPIE 0802, High Power Pulsed Gas Lasers, 0000 (1 January 1987); doi: 10.1117/12.967097
Proc. SPIE 0802, Optical Acceptance Testing For Ultra Precision Air Bearing Machines, 0000 (1 January 1987); doi: 10.1117/12.967098
Proc. SPIE 0802, Microfinish As A Function Of Machine Stiffness, 0000 (1 January 1987); doi: 10.1117/12.967099
Proc. SPIE 0802, A Design Procedure To Tune The Dynamic Stiffness Of An Externally Pressurized Gas Bearing, 0000 (1 January 1987); doi: 10.1117/12.967100
Proc. SPIE 0802, In-Situ Metrology And Machine Based Interferometry For Shape Determination, 0000 (1 January 1987); doi: 10.1117/12.967101
Proc. SPIE 0802, Some Observations On Tool Sharpness And Sub-Surface Damage In Single Point Diamond Turning, 0000 (1 January 1987); doi: 10.1117/12.967102
Proc. SPIE 0802, Response Of Metallic Material To Micromachining, 0000 (1 January 1987); doi: 10.1117/12.967103
Proc. SPIE 0802, Turning Of Optical Glasses At Room Temperature, 0000 (1 January 1987); doi: 10.1117/12.967104
Proc. SPIE 0802, Brittle Fracture Mechanisms In Single Point Glass Abrasion, 0000 (1 January 1987); doi: 10.1117/12.967105
Proc. SPIE 0802, Roof Edge Test (RET) For Micro-Roughness, 0000 (1 January 1987); doi: 10.1117/12.967106
Proc. SPIE 0802, A Non-Contact System For The Measurement Of Cutting Edge Angles Of Rotary Tools, 0000 (1 January 1987); doi: 10.1117/12.967107
Proc. SPIE 0802, In-Process Metrology And Control Of Large Optical Grinders, 0000 (1 January 1987); doi: 10.1117/12.967108
Proc. SPIE 0802, An Application Of Optical Surface Assessment To Engine Preparation Techniques, 0000 (1 January 1987); doi: 10.1117/12.967109
Proc. SPIE 0802, A Novel Optoelectronic Instrument For On-Line Precise Measurements, 0000 (1 January 1987); doi: 10.1117/12.967110
Proc. SPIE 0802, A Unique Solution To Aspheric Measurement And Analysis As Part Ofa Manufacturing Process, 0000 (1 January 1987); doi: 10.1117/12.967111
Proc. SPIE 0802, Surface Profile Measurement Using Optical Grating, 0000 (1 January 1987); doi: 10.1117/12.967112
Proc. SPIE 0802, Precision Mechanical Measurement Of Deep Aspherical Optics, 0000 (1 January 1987); doi: 10.1117/12.967113
Proc. SPIE 0802, In-Process Optical Metrology For Precision Machining, 0000 (1 January 1987); doi: 10.1117/12.967114
Proc. SPIE 0802, In-Process Measurement Of Surface Texture, 0000 (1 January 1987); doi: 10.1117/12.967115
Proc. SPIE 0802, Metal Optics For Laser Profile Scanners, 0000 (1 January 1987); doi: 10.1117/12.967116
Proc. SPIE 0802, Evaluation Of A Commercial Microtopography Sensor, 0000 (1 January 1987); doi: 10.1117/12.967117
Proc. SPIE 0802, Dynamically Focusing Electro-Optical Sensor-System For Micro Rofilometry, 0000 (1 January 1987); doi: 10.1117/12.967118
Proc. SPIE 0802, High-Speed, Pulsed-Laser Interferometry, 0000 (1 January 1987); doi: 10.1117/12.967119
Proc. SPIE 0802, Converting A Commercially Available Linnik Microinterferometer Into A Fringe Scanning Optical Profiler, 0000 (1 January 1987); doi: 10.1117/12.967120
Proc. SPIE 0802, On The Reconstruction Of The Topography Of A Rough Metal Surface By Optical Ellipsometry On The Diffusely Scattered Light. Beyond The First-Order Born Approximation In Vector Scattering Theory, 0000 (1 January 1987); doi: 10.1117/12.967121
Proc. SPIE 0802, Phase-Measuring Interferometers For The Optics Shop, 0000 (1 January 1987); doi: 10.1117/12.967122
Proc. SPIE 0802, M400 - A Coordinate Measuring Machine With 10 nm Resolution, 0000 (1 January 1987); doi: 10.1117/12.967123
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