PROCEEDINGS VOLUME 1019
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 19-23 SEPTEMBER 1988
Thin Film Technologies III
IN THIS VOLUME

0 Sessions, 31 Papers, 0 Presentations
All Papers  (31)
1988 INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
19-23 September 1988
Hamburg, Germany
All Papers
Proc. SPIE 1019, "Nonlinear Optical Effects In Organic Molecules And Polymers -Theory, Measurements And Devices", 0000 (27 February 1989); doi: 10.1117/12.950011
Proc. SPIE 1019, Practical Aspects Of Pumping Systems For Optical Coating, 0000 (27 February 1989); doi: 10.1117/12.950012
Proc. SPIE 1019, Effect Of Process Gas Mixture On Reactively DC Magnetron Sputtered (Al1_xSix)OyNz Thin Films, 0000 (27 February 1989); doi: 10.1117/12.950013
Proc. SPIE 1019, Multilayer Optical Coating Fabrication By Ion Beam Sputter Deposition, 0000 (27 February 1989); doi: 10.1117/12.950014
Proc. SPIE 1019, Control And Activation Techniques For The Optimisation Of The Reactive Sputtering Of TiO2, 0000 (27 February 1989); doi: 10.1117/12.950015
Proc. SPIE 1019, Influence Of Substrate Temperature On Optical Absorption In TiO2 Films, 0000 (27 February 1989); doi: 10.1117/12.950016
Proc. SPIE 1019, Comparison Between Yttrium Oxide And Hydrogenated Amorphous Carbon Thin Films For Infrared Applications As Protective Coatings., 0000 (27 February 1989); doi: 10.1117/12.950017
Proc. SPIE 1019, MAEIP Ti-N Thin Films, 0000 (27 February 1989); doi: 10.1117/12.950018
Proc. SPIE 1019, Microanalysis Of Thin Films, 0000 (27 February 1989); doi: 10.1117/12.950019
Proc. SPIE 1019, Microstructure Analysis Of Thin Films Deposited By Reactive Evaporation And By Reactive Ion-Plating, 0000 (27 February 1989); doi: 10.1117/12.950020
Proc. SPIE 1019, High-Speed Ellipsometer For Thin-Film Deposition Monitoring, 0000 (27 February 1989); doi: 10.1117/12.950021
Proc. SPIE 1019, In-Situ Optical Monitoring Of Thin Films During Evaporation, 0000 (27 February 1989); doi: 10.1117/12.950022
Proc. SPIE 1019, A Flexible On-Line Correction Method For Automated Coating Processes, 0000 (27 February 1989); doi: 10.1117/12.950023
Proc. SPIE 1019, Optical Thickness Monitoring Of Dielectric Optical Filters Using A New In-Situ Photometer With High Signal Resolution And Excellent Long-Term-Stability, 0000 (27 February 1989); doi: 10.1117/12.950024
Proc. SPIE 1019, Coating With High Performance For 10.6 µm Reflection On Large Size Mirrors, 0000 (27 February 1989); doi: 10.1117/12.950025
Proc. SPIE 1019, High Performance AR Coatings For Germanium, 0000 (27 February 1989); doi: 10.1117/12.950026
Proc. SPIE 1019, Intrinsic Mechanical Stresses In Sputtered Aluminium Films, 0000 (27 February 1989); doi: 10.1117/12.950027
Proc. SPIE 1019, Partially Polarizing Stack For The Beam-Combiner With Anisotropic Element, 0000 (27 February 1989); doi: 10.1117/12.950028
Proc. SPIE 1019, Modern Optical Coating Technologies, 0000 (27 February 1989); doi: 10.1117/12.950029
Proc. SPIE 1019, Magnetron Sputtering Deposition Of Ultrathin W-Si Multilayers For X Rays Optics, 0000 (27 February 1989); doi: 10.1117/12.950030
Proc. SPIE 1019, Numerical And Experimental Evaluations Of Multilayer Mirror For Soft X-Rays, 0000 (27 February 1989); doi: 10.1117/12.950032
Proc. SPIE 1019, Laser-Gyro Mirrors Of Differing Layer Structure, 0000 (27 February 1989); doi: 10.1117/12.950033
Proc. SPIE 1019, Development Of A Magneto-Optic Mirror Based On The Transverse Magnetic Kerr Effect, 0000 (27 February 1989); doi: 10.1117/12.950034
Proc. SPIE 1019, Stability Of The Spectral Characteristics Of Ion Plated Interference Filters, 0000 (27 February 1989); doi: 10.1117/12.950035
Proc. SPIE 1019, Experiences With The Reactive Low Voltage Ion Plating In Optical Thin Film Production, 0000 (27 February 1989); doi: 10.1117/12.950036
Proc. SPIE 1019, The Use Of Molecular Beam Techniques For The Fabrication Of Optical Thin Films And Structures, 0000 (27 February 1989); doi: 10.1117/12.950037
Proc. SPIE 1019, Photonic Applications Of Thin Film Gaas Grown On Silicon And Insulating Substrates By Molecular Beam Epitaxy, 0000 (27 February 1989); doi: 10.1117/12.950038
Proc. SPIE 1019, Gradient-Index Thin Films: An Emerging Optical Coating Technology, 0000 (27 February 1989); doi: 10.1117/12.950039
Proc. SPIE 1019, Dielectric Filter Optimization By Simulated Thermal Annealing, 0000 (27 February 1989); doi: 10.1117/12.950040
Proc. SPIE 1019, Reactive Evaporation And Plasma Processes For Thin Film Optical Coatings, 0000 (27 February 1989); doi: 10.1117/12.950041
Proc. SPIE 1019, Linear Electrooptic Effect In Sputtered Polycrystalline LiNbO3 Films, 0000 (27 February 1989); doi: 10.1117/12.950042
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