X-ray and Synchrotron Science
Proc. SPIE 2622, Design and fabrication of a conical mirror for hard x-rays, 0000 (18 August 1995); doi: 10.1117/12.216782
Applications in Astronomy
Proc. SPIE 2622, Imaging unresolved rotating asteroids, 0000 (18 August 1995); doi: 10.1117/12.216800
Proc. SPIE 2622, Applications of matrix lightcurve inversion: an image of Pluto, 0000 (18 August 1995); doi: 10.1117/12.216811
Instrumentation and Measurement
Proc. SPIE 2622, Absorptive bandpass filters for NVIS-compatible crewstations, 0000 (18 August 1995); doi: 10.1117/12.216822
Proc. SPIE 2622, Electronic imaging resolution criteria for light microscopy, 0000 (18 August 1995); doi: 10.1117/12.216833
Proc. SPIE 2622, Instrument factors influencing the precision of measurement of clinical spectrometers, 0000 (18 August 1995); doi: 10.1117/12.216843
Proc. SPIE 2622, Real-time detection of laser damage threshold of AR coating of high-power optics, 0000 (18 August 1995); doi: 10.1117/12.216854
Proc. SPIE 2622, Optically stimulated luminescence dosimeters: an alternative to radiological monitoring films, 0000 (18 August 1995); doi: 10.1117/12.216865
Proc. SPIE 2622, Multiphoton errors in the calibration of photon-counting detectors with radioactive scintillators, 0000 (18 August 1995); doi: 10.1117/12.216876
Proc. SPIE 2622, Quantitative evaluation of the uniformity for an automotive head lamp beam pattern, 0000 (18 August 1995); doi: 10.1117/12.216783
Proc. SPIE 2622, Miniature liquid/air interface sensor, 0000 (18 August 1995); doi: 10.1117/12.216793
Optical Production Methods
Proc. SPIE 2622, Fabrication and testing of 1-in.-diam. solid etalons, 0000 (18 August 1995); doi: 10.1117/12.216794
Ion Beam and Imaging Methods
Proc. SPIE 2622, Blazed diffraction gratings obtained by ion-milling sinusoidal photoresist gratings, 0000 (18 August 1995); doi: 10.1117/12.216795
Proc. SPIE 2622, Planar waveguide fabrication by electron beam bombardment of silica, 0000 (18 August 1995); doi: 10.1117/12.216796
Proc. SPIE 2622, Use of ion beam sputtering in the fabrication of high-quality optical coatings for laser and telecommunication applications, 0000 (18 August 1995); doi: 10.1117/12.216797
Proc. SPIE 2622, Capabilities of existing optical laser pattern generator for large area micro images, 0000 (18 August 1995); doi: 10.1117/12.216798
Plastic Optics and Production
Proc. SPIE 2622, Issues in large-scale production of plastic lenses, 0000 (18 August 1995); doi: 10.1117/12.216799
Proc. SPIE 2622, Injection molding of plastic optics: the basics, 0000 (18 August 1995); doi: 10.1117/12.216801
Proc. SPIE 2622, Coatings for plastic and glass, 0000 (18 August 1995); doi: 10.1117/12.216802
Proc. SPIE 2622, Automated optical assembly, 0000 (18 August 1995); doi: 10.1117/12.216803
Proc. SPIE 2622, Correlation between simulation and result for plastic automotive head lamp optics, 0000 (18 August 1995); doi: 10.1117/12.216804
Proc. SPIE 2622, Precision plastics and LCD display backlighting, 0000 (18 August 1995); doi: 10.1117/12.216805
Proc. SPIE 2622, Design and manufacturing of a high-quality railroad crossing roundel lens, 0000 (18 August 1995); doi: 10.1117/12.216806
Proc. SPIE 2622, Refractive/diffractive optics: promise for the future, 0000 (18 August 1995); doi: 10.1117/12.216807
Diffractive Optics
Proc. SPIE 2622, Finite element simulation of wavelength scale optical elements, 0000 (18 August 1995); doi: 10.1117/12.216808
Proc. SPIE 2622, Aperiodic grating structure for TE11 to TM11 mode conversion, 0000 (18 August 1995); doi: 10.1117/12.216809
Proc. SPIE 2622, Advances in diffractive optical laser resonators, 0000 (18 August 1995); doi: 10.1117/12.216810
Proc. SPIE 2622, Micromillimeter wave spectrum analyser using slanted holographic gratings, 0000 (18 August 1995); doi: 10.1117/12.216812
Nonlinear Devices and Effects
Proc. SPIE 2622, Inexpensive instrumentation for frequency domain detection and localization of heterogeneities utilizing diffusing optical waves, 0000 (18 August 1995); doi: 10.1117/12.216813
Proc. SPIE 2622, Temporal fluctuations of a semilinear photorefractive oscillator, 0000 (18 August 1995); doi: 10.1117/12.216814
Proc. SPIE 2622, Optical phase conjugation with gain in a bulk semiconductor, 0000 (18 August 1995); doi: 10.1117/12.216815
Proc. SPIE 2622, Optimized surfaces for second harmonic generation from surface-plasmon polaritons: theory and experiment, 0000 (18 August 1995); doi: 10.1117/12.216816
Fiber Optic Sensor Technology
Proc. SPIE 2622, Frequency response of a polarization-maintaining optical fiber interferometer for simultaneous measurement of strain and temperature, 0000 (18 August 1995); doi: 10.1117/12.216817
Proc. SPIE 2622, Laser ultrasound system with embedded fiber optic interferometric sensor, 0000 (18 August 1995); doi: 10.1117/12.216818
Proc. SPIE 2622, Fiber optic powered remote gas monitor, 0000 (18 August 1995); doi: 10.1117/12.216819
Proc. SPIE 2622, Delamination detection of composite plates using fiber optic sensors, 0000 (18 August 1995); doi: 10.1117/12.216820
Proc. SPIE 2622, Etched optical fiber sensors and components, 0000 (18 August 1995); doi: 10.1117/12.216821
Proc. SPIE 2622, All-fiber in-line Sagnac interferometer current sensor, 0000 (18 August 1995); doi: 10.1117/12.216823
Proc. SPIE 2622, Fiber optic on-line color monitor for flowing powders, 0000 (18 August 1995); doi: 10.1117/12.216824
Fiber Technology
Proc. SPIE 2622, Self electro-optic effect on an optical fiber, 0000 (18 August 1995); doi: 10.1117/12.216825
Proc. SPIE 2622, Pseudo-amplification and frequency multiplication of acoustic signals using an optical fiber, 0000 (18 August 1995); doi: 10.1117/12.216826
Proc. SPIE 2622, Optimization of dispersion-compensating axial index profiles for compressing ultrashort optical pulses in optical fibers, 0000 (18 August 1995); doi: 10.1117/12.216827
Proc. SPIE 2622, In-fiber frequency shifter using acousto-optic polarization mode coupling, 0000 (18 August 1995); doi: 10.1117/12.216828
Sources and Emitters
Proc. SPIE 2622, Characterization of gallium nitride (GaN) blue LEDs, 0000 (18 August 1995); doi: 10.1117/12.216829
Proc. SPIE 2622, Numerical simulation of gate turn-off (GTO) light-emitting thyristors, 0000 (18 August 1995); doi: 10.1117/12.216830
Proc. SPIE 2622, Characteristics of an AlGaN/InGaN light-emitting diode, 0000 (18 August 1995); doi: 10.1117/12.216831
Electron Microscopy and Analysis
Proc. SPIE 2622, Detection of heterogeneities within a scattering medium using Raman spectroscopy, 0000 (18 August 1995); doi: 10.1117/12.216832
Proc. SPIE 2622, Characterization of diamond thin films using transmission electron microscopy, 0000 (18 August 1995); doi: 10.1117/12.216834
LCD Materials and Displays
Proc. SPIE 2622, Black-on-white polymer-stabilized cholesteric formulations, 0000 (18 August 1995); doi: 10.1117/12.216835
Proc. SPIE 2622, Surface and polymer network stabilized reflective cholesteric liquid crystal displays, 0000 (18 August 1995); doi: 10.1117/12.216836
Displays and Applications
Proc. SPIE 2622, LCD projection technology, 0000 (18 August 1995); doi: 10.1117/12.216837
Proc. SPIE 2622, Optical character recognition using a real-time correlator, 0000 (18 August 1995); doi: 10.1117/12.216838
Holography and Applications
Proc. SPIE 2622, Simple real-time 3D holographic stereogram, 0000 (18 August 1995); doi: 10.1117/12.216839
Proc. SPIE 2622, Color holography, 0000 (18 August 1995); doi: 10.1117/12.216840
Proc. SPIE 2622, Holography with short pulses and other broad spectrum light, 0000 (18 August 1995); doi: 10.1117/12.216841
Proc. SPIE 2622, New fiber optics illumination system for application to electronics holography, 0000 (18 August 1995); doi: 10.1117/12.216842
Electronic Interferometry
Proc. SPIE 2622, Design of a simple recursive filter for processing ESPI fringe patterns, 0000 (18 August 1995); doi: 10.1117/12.216844
Proc. SPIE 2622, Applications of an iteration algorithm for shearographic fringe pattern analysis, 0000 (18 August 1995); doi: 10.1117/12.216845
Proc. SPIE 2622, Electronic speckle pattern shearing interferometer using a holographic grating, 0000 (18 August 1995); doi: 10.1117/12.216846
Proc. SPIE 2622, Phase measuring interferometry algorithms, 0000 (18 August 1995); doi: 10.1117/12.216847