Paper
13 November 2007 Growth of iron films on silicon: effect of the deposition rate
A. S. Gouralnik, N. G. Galkin, V. I. Ivanov
Author Affiliations +
Proceedings Volume 6423, International Conference on Smart Materials and Nanotechnology in Engineering; 64230F (2007) https://doi.org/10.1117/12.779221
Event: International Conference on Smart Materials and Nanotechnology in Engineering, 2007, Harbin, China
Abstract
Growth and magnetism of thin iron films on the surfaces Si(100), Si(111) and Si(111)-4° are studied by in situ SMOKE and ex-situ AFM methods. Comparison of growth modes for slow and ultra-fast deposition is given. Design of the pulse-type ultra-fast evaporator is described.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. S. Gouralnik, N. G. Galkin, and V. I. Ivanov "Growth of iron films on silicon: effect of the deposition rate", Proc. SPIE 6423, International Conference on Smart Materials and Nanotechnology in Engineering, 64230F (13 November 2007); https://doi.org/10.1117/12.779221
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KEYWORDS
Iron

Silicon

Atomic force microscopy

Ultrafast phenomena

Magnetism

Chemical species

Silicon films

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