Cassiano Bueno
at CNPEM
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 October 2022 Presentation + Paper
Proceedings Volume 12240, 122400F (2022) https://doi.org/10.1117/12.2633679
KEYWORDS: Stitching interferometry, X-ray optics, Fizeau interferometers, Synchrotron radiation instrumentation, Synchrotron technology, Mirrors, Calibration, Optical alignment, Metrology, Optical metrology, Tolerancing

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