Dr. Christoph Munkelt
at Fraunhofer-IOF
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | May 15, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Near infrared, 3D acquisition, Sensors, Sensor networks, 3D metrology, Projection systems, Sensor fusion, Motion analysis, Sensor technology

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Visualization, Calibration, Coating, Laser processing, 3D modeling, 3D metrology, 3D scanning, Computer aided design, Solid modeling, Visibility

SPIE Journal Paper | June 3, 2013
OE Vol. 52 Issue 06
KEYWORDS: Cameras, Projection systems, Error analysis, 3D metrology, Sensors, Clouds, Phase measurement, Raster graphics, Calibration, Optical engineering

PROCEEDINGS ARTICLE | May 30, 2013
Proc. SPIE. 8790, Optics for Arts, Architecture, and Archaeology IV
KEYWORDS: Visualization, Sensors, Field programmable gate arrays, 3D modeling, Image registration, Laser scanners, 3D metrology, Optical tracking, 3D scanning, Motion estimation

PROCEEDINGS ARTICLE | October 23, 2010
Proc. SPIE. 7830, Image and Signal Processing for Remote Sensing XVI
KEYWORDS: Data modeling, Cameras, Sensors, Calibration, Error analysis, Clouds, 3D modeling, 3D metrology, Projection systems, Raster graphics

PROCEEDINGS ARTICLE | October 11, 2007
Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V
KEYWORDS: Imaging systems, Cameras, Sensors, Calibration, Clouds, Head, Image sensors, 3D metrology, Projection systems, 3D scanning

Showing 5 of 10 publications
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