Prof. Gunther Notni
Head of Optical Systems at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Symposium Chair | Author
Publications (100)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Thermography, Mid-IR, Cameras, 3D modeling, 3D metrology, Infrared radiation

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V
KEYWORDS: Light sources, Imaging systems, Cameras, Sensors, Image processing, Quantum efficiency, Image sensors

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Hyperspectral imaging, Sensors, 3D metrology, Projection systems, 3D image processing, Structured light

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V
KEYWORDS: Reflection, Imaging systems, Glasses, Spectroscopy, Ultraviolet radiation, Electrons, Lamps, Imaging spectroscopy, Reflectance spectroscopy, Plasma

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Thermography, Mid-IR, Polymethylmethacrylate, 3D applications, Cameras, Glasses, 3D metrology, Gas lasers, 3D image processing

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Sensors, 3D metrology, Projection systems, Device simulation

Showing 5 of 100 publications
Conference Committee Involvement (17)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
14 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Showing 5 of 17 published special sections
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