Dr. Peter Kühmstedt
at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (57)

PROCEEDINGS ARTICLE | July 11, 2017
Proc. SPIE. 10331, Optics for Arts, Architecture, and Archaeology VI
KEYWORDS: 3D metrology, 3D scanning, Forensic science, Cameras, Scanners, 3D acquisition, 3D modeling, Laser scanners, Digital forensics, Mobile devices, Data acquisition, Rapid manufacturing, Power supplies

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: 3D scanning, 3D metrology, Distance measurement, Water, 3D modeling, Photogrammetry, Refraction, Cameras, Glasses, Calibration, Imaging systems, Stereoscopic cameras, Structured light, Fringe analysis

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10332, Videometrics, Range Imaging, and Applications XIV
KEYWORDS: Calibration, 3D scanning, Distortion, 3D metrology, Sensors, Optical calibration, Stereoscopic cameras, Rapid manufacturing, Cultural heritage, Medicine, Cameras, Structured light, Scanners, Error analysis

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: 3D metrology, Near infrared, Optical testing, Sensors, 3D modeling, Motion measurement, Nondestructive evaluation, 3D scanning, Medicine, Safety, Projection systems, 3D image processing, Cameras, Light emitting diodes, Clouds, Microlens array, Optical spheres, 3D surface sensing, 3D applications, 3D acquisition

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Cameras, Clouds, Calibration, Light sources, Projection systems, 3D metrology, Bidirectional reflectance transmission function, Sensors, Inspection, Reflectivity, Optical metrology, High speed cameras, Digital Light Processing

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: Fringe analysis, 3D metrology, Projection systems, 3D image processing, High speed cameras, Binary data, Cameras, Clouds, Sensors, Electroluminescent displays

Showing 5 of 57 publications
Conference Committee Involvement (8)
Dimensional Optical Metrology and Inspection for Practical Applications VII
15 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications III
5 May 2014 | Baltimore, Maryland, United States
Showing 5 of 8 published special sections
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