Dr. Peter Kühmstedt
at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (57)

PROCEEDINGS ARTICLE | July 11, 2017
Proc. SPIE. 10331, Optics for Arts, Architecture, and Archaeology VI
KEYWORDS: Mobile devices, 3D acquisition, Cameras, Scanners, Forensic science, Power supplies, 3D modeling, Data acquisition, Laser scanners, 3D metrology, 3D scanning, Rapid manufacturing, Digital forensics

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Fringe analysis, Imaging systems, Cameras, Calibration, Water, Glasses, 3D modeling, Photogrammetry, Refraction, Stereoscopic cameras, Distance measurement, 3D metrology, 3D scanning, Structured light

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10332, Videometrics, Range Imaging, and Applications XIV
KEYWORDS: Medicine, Cameras, Sensors, Calibration, Scanners, Error analysis, Distortion, Cultural heritage, Stereoscopic cameras, 3D metrology, 3D scanning, Optical calibration, Rapid manufacturing, Structured light

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Near infrared, Light emitting diodes, Safety, Medicine, Microlens array, 3D acquisition, 3D surface sensing, Optical spheres, 3D applications, Cameras, Sensors, Nondestructive evaluation, Clouds, 3D modeling, Optical testing, 3D metrology, Projection systems, 3D scanning, Motion measurement, 3D image processing

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Light sources, Cameras, Sensors, Calibration, Inspection, Reflectivity, Clouds, Optical metrology, Bidirectional reflectance transmission function, High speed cameras, 3D metrology, Projection systems, Digital Light Processing

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: Fringe analysis, Cameras, Sensors, Clouds, High speed cameras, 3D metrology, Projection systems, Electroluminescent displays, Binary data, 3D image processing

Showing 5 of 57 publications
Conference Committee Involvement (8)
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications III
5 May 2014 | Baltimore, Maryland, United States
Showing 5 of 8 published special sections
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