Dr. Dennis Floyd Gardner Jr
Research Assistant at JILA
SPIE Involvement:
Author
Area of Expertise:
Liquid Crystals , Confocal Fluorescent Microscopy , Polarized microscopy , Freeze Fracture Tramsmisson Electron Microscopy
Websites:
Profile Summary

I am an undergraduate student at the University of Colorado at Boulder working with Professor Ivan I. Smalyukh and the Liquid Crystal Materials Research Center.

I study the self-assembly of nanoparticles in liquid crystals. I use a variety of microscopy techniques including confocal fluorescent microscopy to image the 3D location of fluorescent nanoparticles in liquid crystal defects and structures. I also use freeze fracture transmission electron microscopy to image individual nanoparticles the liquid crystal defects and structures.

I am planning to finish my undergraduate thesis in the fall of 2009 and graduate in the spring of 2010.
Publications (10)

PROCEEDINGS ARTICLE | March 28, 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Microscopes, Diffraction, Mirrors, Detection and tracking algorithms, Sensors, Image resolution, Image transmission, Extreme ultraviolet, Reconstruction algorithms, Spatial resolution

PROCEEDINGS ARTICLE | September 30, 2016
Proc. SPIE. 9948, Novel Optical Systems Design and Optimization XIX
KEYWORDS: Microscopes, Diffraction, Coherence imaging, Imaging systems, Sensors, X-rays, Image resolution, Data acquisition, Extreme ultraviolet, X-ray imaging

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Coherence imaging, Mirrors, Spectroscopy, Microscopy, Interfaces, Imaging spectroscopy, Extreme ultraviolet, High harmonic generation, Overlay metrology

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Diffraction, Coherence imaging, Microscopy, Photons, X-rays, Silicon, Reflectivity, Multiplexing, Phase imaging, Process control, Extreme ultraviolet, Coherent x-ray sources, Defect inspection

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Coherence imaging, Metrology, Polarization, Spatial filters, Spectroscopy, Wave propagation, Deconvolution, Reconstruction algorithms, Laser beam diagnostics, Diffraction gratings

PROCEEDINGS ARTICLE | October 8, 2014
Proc. SPIE. 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
KEYWORDS: Mirrors, Crystals, X-rays, Silicon, Diodes, Laser crystals, Semiconducting wafers, Hard x-rays, Prototyping, Liquid crystal lasers

Showing 5 of 10 publications
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