Frank Geelhaar
at Synopsys Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 April 2023 Presentation
Proceedings Volume 12495, 1249510 (2023) https://doi.org/10.1117/12.2658572
KEYWORDS: Transistors, Device simulation, Back end of line, TCAD, Standards development, Process modeling, Performance modeling, Oscillators, New and emerging technologies, Multilayers

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