Dr. Jérôme M. Vaillant
at CEA-LETI
SPIE Involvement:
Author
Area of Expertise:
CMOS image sensor , Optical simulation , Wavefront sensor , Adaptive Optics
Publications (16)

PROCEEDINGS ARTICLE | January 24, 2011
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Optical filters, Optical lithography, Sensors, Metals, Silicon, Quantum efficiency, Image resolution, Image sensors, Optical resolution, Transistors

PROCEEDINGS ARTICLE | January 24, 2011
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Signal to noise ratio, Visualization, Cameras, Sensors, Image processing, Image resolution, Colorimetry, Image sensors, Optical resolution, RGB color model

PROCEEDINGS ARTICLE | January 24, 2011
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Signal to noise ratio, CMOS sensors, Cameras, Sensors, Image processing, Quantum efficiency, Image quality, Image sensors, Microlens, Device simulation

PROCEEDINGS ARTICLE | May 6, 2010
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: CMOS sensors, Sensors, Electrons, Silicon, Quantum efficiency, Doping, 3D modeling, Optical simulations, Electro optics, Electro optical modeling

PROCEEDINGS ARTICLE | March 30, 2010
Proc. SPIE. 7639, Advances in Resist Materials and Processing Technology XXVII
KEYWORDS: Calibration, Image processing, Diffusion, Atomic force microscopy, Photoresist materials, Microlens, Photomasks, Spherical lenses, Photoresist processing, Grayscale lithography

PROCEEDINGS ARTICLE | January 19, 2010
Proc. SPIE. 7537, Digital Photography VI
KEYWORDS: Signal to noise ratio, Human-machine interfaces, Cameras, Sensors, Image processing, Quantum efficiency, Reflectivity, Interference (communication), Image quality, RGB color model

Showing 5 of 16 publications
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