Dr. Jimmy H. Ni Profile

Dr. Jimmy H. Ni

at DEVCOM Army Research Lab

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Author

Publications (5)

Proceedings Article | 3 October 2022 Presentation

Plasma frequency tuning of epsilon-near-zero metafilm with ITO-SiO2 multilayer structure

Jimmy Ni

Proceedings Volume PC12195, PC121950I (2022) https://doi.org/10.1117/12.2633619

KEYWORDS: Multilayers, Plasma, Transparent conductors, Transparent conducting oxide, Transmittance, Near infrared, Ellipsometry, Dielectrics, Annealing

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Proceedings Article | 3 August 2021 Presentation

Engineered epsilon-near-zero metafilm with Ag-SiNx multilayer structure

Jimmy Ni

Proceedings Volume 11795, 117951A (2021) https://doi.org/10.1117/12.2593859

KEYWORDS: Multilayers, Silver, Structural engineering, Ellipsometry, Sputter deposition, Plasma, Near infrared

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Proceedings Article | 5 March 2021 Presentation + Paper

Development of thick epsilon-near-zero ITO metafilms for use in metastructure and metasurface devices

Andrew DeLoach, Jimmy Ni, Asher Leff, Wendy Sarney, Weimin Zhou

Proceedings Volume 11695, 116950U (2021) https://doi.org/10.1117/12.2582748

KEYWORDS: Sputter deposition, Optical properties, Tin, Oxides, Indium, Optoelectronics, Annealing, Waveguides, Telecommunications, Spectroscopic ellipsometry

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SPIE Journal Paper | 27 February 2021 Open Access

Developing a chip-scale optical clock

Weimin Zhou, James Cahill, Jimmy Ni, Andrew Deloach, Sang-Yeon Cho, Stephen Anderson, Tanvir Mahmood, Patrick Sykes, Wendy Sarney, Asher Leff

OE, Vol. 60, Issue 02, 027107, (February 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.2.027107

KEYWORDS: Interferometers, Resonators, Microwave radiation, Waveguides, Optical clocks, Silicon, Clocks, Cladding, Metamaterials, Optical engineering

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Proceedings Article | 9 September 2019 Presentation

Thick epsilon-near-zero metamaterial film (Conference Presentation)

Jimmy Ni, Wendy Sarney, Asher Leff, James Cahill, Weimin Zhou

Proceedings Volume 11080, 110801Z (2019) https://doi.org/10.1117/12.2529520

KEYWORDS: Metamaterials, Transmission electron microscopy, Crystals, Indium, Annealing, Silica, Tin, Oxides, Silicon, Semiconducting wafers

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