Dr. Jimmy H. Ni
at DEVCOM Army Research Lab
SPIE Involvement:
Publications (5)

Proceedings Article | 3 October 2022 Presentation
Proceedings Volume PC12195, PC121950I (2022) https://doi.org/10.1117/12.2633619
KEYWORDS: Multilayers, Plasma, Transparent conductors, Transparent conducting oxide, Transmittance, Near infrared, Ellipsometry, Dielectrics, Annealing

Proceedings Article | 3 August 2021 Presentation
Proceedings Volume 11795, 117951A (2021) https://doi.org/10.1117/12.2593859
KEYWORDS: Multilayers, Silver, Structural engineering, Ellipsometry, Sputter deposition, Plasma, Near infrared

Proceedings Article | 5 March 2021 Presentation + Paper
Andrew DeLoach, Jimmy Ni, Asher Leff, Wendy Sarney, Weimin Zhou
Proceedings Volume 11695, 116950U (2021) https://doi.org/10.1117/12.2582748
KEYWORDS: Sputter deposition, Optical properties, Tin, Oxides, Indium, Optoelectronics, Annealing, Waveguides, Telecommunications, Spectroscopic ellipsometry

SPIE Journal Paper | 27 February 2021 Open Access
Weimin Zhou, James Cahill, Jimmy Ni, Andrew Deloach, Sang-Yeon Cho, Stephen Anderson, Tanvir Mahmood, Patrick Sykes, Wendy Sarney, Asher Leff
OE, Vol. 60, Issue 02, 027107, (February 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.2.027107
KEYWORDS: Interferometers, Resonators, Microwave radiation, Waveguides, Optical clocks, Silicon, Clocks, Cladding, Metamaterials, Optical engineering

Proceedings Article | 9 September 2019 Presentation
Jimmy Ni, Wendy Sarney, Asher Leff, James Cahill, Weimin Zhou
Proceedings Volume 11080, 110801Z (2019) https://doi.org/10.1117/12.2529520
KEYWORDS: Metamaterials, Transmission electron microscopy, Crystals, Indium, Annealing, Silica, Tin, Oxides, Silicon, Semiconducting wafers

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