Prof. John W. V. Miller
Associate Professor at Univ of Michigan
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (46)

PROCEEDINGS ARTICLE | November 17, 2005
Proc. SPIE. 5999, Intelligent Systems in Design and Manufacturing VI
KEYWORDS: MATLAB, Cameras, Databases, Image processing, Computing systems, Control systems, Computer programming, Machine vision, Java, Intelligence systems

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Clocks, Detection and tracking algorithms, Sensors, Image processing, Inspection, Linear filtering, Machine vision, Convolution, Nonlinear filtering, Bandpass filters

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Clocks, Spatial frequencies, Matrices, Inspection, Computing systems, Image quality, Machine vision, Fractal analysis, Raster graphics, Electrochemical etching

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Internet, MATLAB, Imaging systems, Cameras, Image processing, Inspection, Control systems, Light sources and illumination, Machine vision, Prototyping

PROCEEDINGS ARTICLE | December 16, 2004
Proc. SPIE. 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
KEYWORDS: Optical filters, Imaging systems, Cameras, Control systems, Image analysis, Data acquisition, Neural networks, Lutetium, Collision avoidance, Classification systems

PROCEEDINGS ARTICLE | December 16, 2004
Proc. SPIE. 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
KEYWORDS: Image processing, Remote sensing, Control systems, Distortion, Feature extraction, Image analysis, Image registration, Printing, Data processing, Digital imaging

Showing 5 of 46 publications
Conference Committee Involvement (10)
Two- and Three-Dimensional Methods for Inspection and Metrology V
12 September 2007 | Boston, MA, United States
Two- and Three-Dimensional Methods for Inspection and Metrology IV
1 October 2006 | Boston, Massachusetts, United States
Two- and Three-Dimensional Methods for Inspection and Metrology III
25 October 2005 | Boston, MA, United States
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
26 October 2004 | Philadelphia, Pennsylvania, United States
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
29 October 2003 | Providence, RI, United States
Showing 5 of 10 published special sections
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