Dr. Mark R. Skokan Profile

Dr. Mark R. Skokan

Principal Scientist

SPIE Involvement:

Author

Publications (17)

Proceedings Article | 27 May 2022 Presentation + Paper

Presentation + Paper

High operating temperature (HOT) midwave infrared (MWIR) 6 µm pitch camera core performance and maturity

Thomas Shafer, Ramon Torres-Valladolid, Robert Burford, Thomas Buerger, Graham Averitt, Mark Skokan, Matt Babyak, Christopher Martin, Doug VanDover, Tony Ragucci

Proceedings Volume 12107, 121070V (2022) https://doi.org/10.1117/12.2618719

KEYWORDS: Cameras, Modulation transfer functions, Mid-IR, Sensors, Reliability, Staring arrays, Accelerated life testing, Simulation of CCA and DLA aggregates, Failure analysis, Temperature metrology

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Proceedings Article | 18 September 2018 Presentation + Paper

Presentation + Paper

High operating temperature MCT discrete detector data and analysis

E. Robinson, V. R. Khalap, A. D'Souza, M. Skokan, M. Kinch

Proceedings Volume 10766, 107660E (2018) https://doi.org/10.1117/12.2323256

KEYWORDS: Sensors, Temperature metrology, Mercury, Measurement devices, Doping, Mid-IR, Mercury cadmium telluride, Metals, Diffusion, Infrared sensors

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Proceedings Article | 13 May 2015 Paper

Paper

Linear mode photon counting from visible to MWIR with HgCdTe avalanche photodiode focal plane arrays

William Sullivan, Jeffrey Beck, Richard Scritchfield, Mark Skokan, Pradip Mitra, Xiaoli Sun, James Abshire, Darren Carpenter, Barry Lane

Proceedings Volume 9492, 94920T (2015) https://doi.org/10.1117/12.2180394

KEYWORDS: Readout integrated circuits, Metals, Mercury cadmium telluride, Diodes, Staring arrays, Sensors, Photon counting, Signal to noise ratio, Avalanche photodetectors, Mirrors

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Proceedings Article | 8 February 2015 Paper

Paper

Advances in three-dimensional integration technologies in support of infrared focal plane arrays

D. Temple, E. Vick, D. Malta, M. Lueck, M. Skokan, C. Masterjohn, M. Muzilla

Proceedings Volume 9370, 93701L (2015) https://doi.org/10.1117/12.2082877

KEYWORDS: Readout integrated circuits, Staring arrays, Signal processing, Silicon, Sensors, Analog electronics, Infrared radiation, Semiconducting wafers, Infrared sensors, Metals

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Proceedings Article | 24 June 2014 Paper

Paper

HDVIP five-micron pitch HgCdTe focal plane arrays

J. Armstrong, M. Skokan, M. Kinch, J. Luttmer

Proceedings Volume 9070, 907033 (2014) https://doi.org/10.1117/12.2053286

KEYWORDS: Long wavelength infrared, Mercury cadmium telluride, Mid-IR, Diodes, Staring arrays, Infrared detectors, Infrared imaging, Defense and security, Infrared radiation, Sensors

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Proceedings Article | 21 May 2014 Paper

Paper

Enabling more capability within smaller pixels: advanced wafer-level process technologies for integration of focal plane arrays with readout electronics

Dorota Temple, Erik Vick, Matthew Lueck, Dean Malta, Mark Skokan, Christopher Masterjohn, Mark Muzilla

Proceedings Volume 9100, 91000L (2014) https://doi.org/10.1117/12.2054106

KEYWORDS: Readout integrated circuits, Semiconducting wafers, Analog electronics, Staring arrays, Silicon, Metals, 3D modeling, Electronics, Infrared radiation, Optical alignment

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Proceedings Article | 21 May 2013 Paper

Paper

A highly sensitive multi-element HgCdTe e-APD detector for IPDA lidar applications

Jeff Beck, James McCurdy, Mark Skokan, Chris Kamilar, Richard Scritchfield, Terry Welch, Pradip Mitra, Xiaoli Sun, James Abshire, Kirk Reiff

Proceedings Volume 8739, 87390V (2013) https://doi.org/10.1117/12.2018083

KEYWORDS: Avalanche photodetectors, Sensors, Readout integrated circuits, Mercury cadmium telluride, LIDAR, Amplifiers, Absorption, Detector arrays, Electronics, Carbon dioxide

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Proceedings Article | 4 May 2010 Paper

Paper

SWIR HgCdTe HDVIP detectors MTF Monte Carlo modeling and data

A. D'Souza, M. Stapelbroek, C. Yoneyama, P. Ely, M. Skokan, H. Shih

Proceedings Volume 7660, 76600Q (2010) https://doi.org/10.1117/12.849554

KEYWORDS: Sensors, Modulation transfer functions, Monte Carlo methods, Data modeling, Mercury cadmium telluride, Diffusion, Fourier transforms, Short wave infrared radiation, Photons, Metals

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Proceedings Article | 7 May 2009 Paper

Paper

Visible to SWIR response of HgCdTe HDVIP detectors

A. D'Souza, E. Robinson, M. Stapelbroek, W. Wong, M. Skokan, H.-D. Shih

Proceedings Volume 7298, 72981X (2009) https://doi.org/10.1117/12.819206

KEYWORDS: Sensors, Quantum efficiency, Visible radiation, Short wave infrared radiation, Mercury cadmium telluride, Infrared sensors, Photons, Readout integrated circuits, Data modeling, Near infrared

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Proceedings Article | 7 May 2009 Paper

Paper

Performance and modeling of the MWIR HgCdTe electron avalanche photodiode

Jeffrey Beck, Richard Scritchfield, Billy Sullivan, Jamie Teherani, Chang-Feng Wan, Mike Kinch, Martha Ohlson, Mark Skokan, Lewis Wood, Pradip Mitra, Mike Goodwin, Jim Robinson

Proceedings Volume 7298, 729838 (2009) https://doi.org/10.1117/12.819045

KEYWORDS: Avalanche photodetectors, Diodes, Diffusion, Mid-IR, Point spread functions, Capacitance, Mercury cadmium telluride, Performance modeling, Signal to noise ratio, Absorption

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Proceedings Article | 8 June 2007 Paper

Paper

Noise characteristics of HDVIP HgCdTe LWIR detectors

A. D'Souza, M. Stapelbroek, E. Robinson, C. Yoneyama, H. Mills, M. Kinch, M. Skokan, H. D. Shih

Proceedings Volume 6542, 65423L (2007) https://doi.org/10.1117/12.721143

KEYWORDS: Sensors, Mercury cadmium telluride, Long wavelength infrared, Interference (communication), Lithium, Data acquisition, Readout integrated circuits, Fourier transforms, Diodes, Image quality

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DRS LPE-grown SWIR, MWIR and LWIR HgCdTe material are fabricated in the High-Density Vertically Integrated Photodiode (HDVIP) architecture. Instruments manufactured for certain strategic applications have severe constraints on excess low frequency noise due to the effect the noise has on the image quality with subsequent consequences on the period of calibration. This paper will present data and analysis of excess low frequency noise in LWIR (&lgr;_c ~ 10.5 &mgr;m @ 60 K) HDVIP HgCdTe detectors. The vehicle for noise measurements is a multiplexed 320 x 6 array of 40 &mgr;m x 50 &mgr;m, 10.5 &mgr;m cutoff, HgCdTe detectors. Noise has been measured on a column of 320 detectors, at 60 K, as a function of frequency at zero and 50 mV reverse bias. Integration time for the measurement was 1.76 ms. Output voltage for the detectors was sampled every 10^th or every 100^th frame. 32,768 frames of time series data were collected for a total record length of 98 minutes. Since the total time for collecting the 32,768 time data series points is 98 minutes, the minimum frequency is 170 &mgr;Hz. Time series and Fourier transform data on individual detectors at 0 mV and 50 mV reverse bias in the dark have been studied. Examination of the detector current time series and Fourier transform curves thereof, reveal a variety of interesting characteristics: (i) time series displaying switching between four states characteristic of random telegraph signal (RTS) noise, the noise current power spectrum having Lorentzian type characteristics; (ii) time series data exhibiting slight wave-like characteristics with the noise current power spectrum being 1/f-like at low frequencies; (iii) pronounced wave-like characteristics in the time series with the noise current power spectrum being 1/f²-like at low frequencies; and (iv) time series having a mean value independent of time with the noise current power spectrum being white. The predominance of detectors examined had minimal excess low frequency noise down to ~ 10 mHz. In addition some isolated diodes had characteristics that lay between the four main types outlined above.

Proceedings Article | 30 April 2007 Paper

Paper

Advances in 3D integration of heterogeneous materials and technologies

D. Temple, J. Lannon, D. Malta, J. Robinson, P. Coffman, T. Welch, M. Skokan, A. Moll, W. Knowlton

Proceedings Volume 6544, 65440I (2007) https://doi.org/10.1117/12.722502

KEYWORDS: Silicon, Semiconducting wafers, Resistance, Microelectromechanical systems, Staring arrays, Readout integrated circuits, Infrared imaging, Wafer bonding, 3D image processing, Metals

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Proceedings Article | 8 September 2006 Paper

Paper

SWIR hyperspectral detection with integrated HgCdTe detector and tunable MEMS filter

P. Mitra, J. Beck, M. Skokan, J. Robinson, J. Antoszewski, K. Winchester, A. Keating, T. Nguyen, K. K. M. B. D. Silva, C. Musca, J. Dell, L. Faraone

Proceedings Volume 6295, 62950G (2006) https://doi.org/10.1117/12.685469

KEYWORDS: Sensors, Mercury cadmium telluride, Mirrors, Optical filters, Tunable filters, Electronic filtering, Photoresistors, Silicon, Short wave infrared radiation, Microelectromechanical systems

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Proceedings Article | 18 May 2006 Paper

Paper

SWIR to LWIR HDVIP HgCdTe detector array performance

A. D'Souza, M. Stapelbroek, L. Dawson, P. Ely, C. Yoneyama, J. Reekstin, M. Skokan, M. Kinch, P. Liao, M. Ohlson, P. Ronci, T. Teherani, H. Shih, J. Robinson

Proceedings Volume 6206, 62062H (2006) https://doi.org/10.1117/12.669071

KEYWORDS: Sensors, Long wavelength infrared, Readout integrated circuits, Short wave infrared radiation, Mercury cadmium telluride, Quantum efficiency, Detector arrays, Mid-IR, Staring arrays, Diodes

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DRS uses LPE-grown SWIR, MWIR and LWIR HgCdTe material to fabricate High-Density Vertically Integrated Photodiode (HDVIP) architecture detectors. 2.5 μm, 5.3 μm and 10.5 μm cutoff detectors have been fabricated into linear arrays as technology demonstrations targeting remote sensing programs. This paper presents 320 x 6 array configuration technology demonstrations' performance of HDVIP HgCdTe detectors and single detector noise data. The single detector data are acquired from within the 320 x 6 array. Within the arrays, the detector size is 40 μm x 50 μm. The MWIR detector array has a mean quantum efficiency of 89.2% with a standard deviation to mean ratio, σ/μ = 1.51%. The integration time for the focal plane array (FPA) measurements is 1.76 ms with a frame rate of 557.7 Hz. Operability values exceeding 99.5% have been obtained. The LWIR arrays measured at 60 K had high operability with only ~ 3% of the detectors having out of family response. Using the best detector select (BDS) feature in the read out integrated circuit (ROIC), a feature that picks out the best detector in every row of six detectors, a 320 x 1 array with 100% operability is obtained. For the 320 x 1 array constituted using the BDS feature, a 100% operable LWIR array with average NEI value of 1.94 x 10¹¹ ph/cm²/s at a flux of 7.0 x 10¹⁴ ph/cm²/s has been demonstrated. Noise was measured at 60 K and 50 mV reverse bias on a column of 320 diodes from a 320 x 6 LWIR array. Integration time for the measurement was 1.76 ms. Output voltage for the detectors was sampled every 100^th frame. 32,768 frames of time series data were collected for a total record length of 98 minutes. The frame average for a number of detectors was subtracted from each detector to correct for temperature drift and any common-mode noise. The corrected time series data was Fourier transformed to obtain the noise spectral density as a function of frequency. Since the total time for collecting the 32,768 time data series points is 98.0 minutes, the minimum frequency is 170 μHz. A least squares fit of the form (A/f + B) is made to the noise spectral density data to extract coefficients A and B that relate to the 1/f and white noise of the detector respectively. In addition noise measurements were also acquired on columns of SWIR detectors. Measurements were made under illuminated conditions at 4 mV and 50 mV reverse bias and under dark conditions at 50 mV reverse bias. The total collection time for the SWIR detectors was 47.7 minutes. The detectors are white noise limited down to ~10 mHz under dark conditions and down to ~ 100 mHz under illuminated conditions.

Proceedings Article | 21 October 2005 Paper

Paper

SWIR to LWIR HgCdTe detectors and FPAs for remote sensing applications

A. D'Souza, M. Stapelbroek, L. Dawson, P. Ely, C. Yoneyama, J. Reekstin, H.-D. Shih, M. Skokan, T. Teherani, J. Robinson

Proceedings Volume 5978, 597818 (2005) https://doi.org/10.1117/12.627752

KEYWORDS: Sensors, Long wavelength infrared, Quantum efficiency, Readout integrated circuits, Remote sensing, Diodes, Mercury cadmium telluride, Mid-IR, Detector arrays, Short wave infrared radiation

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Proceedings Article | 7 July 2005 Paper

Paper

MEMS based tunable infrared sensors

J. Antoszewski, K. Winchester, A. Keating, T. Nguyen, K. K. M. B. D. Silva, H. Huang, C. Musca, J. Dell, L. Faraone, P. Mitra, J. Beck, M. Skokan, J. Robinson

Proceedings Volume 5840, (2005) https://doi.org/10.1117/12.624884

KEYWORDS: Mirrors, Microelectromechanical systems, Mercury cadmium telluride, Sensors, Optical filters, Short wave infrared radiation, Silicon, Photodiodes, Infrared sensors, Infrared radiation

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Proceedings Article | 31 May 2005 Paper

Paper

A monolithically integrated HgCdTe SWIR photodetector and tunable MEMS-based optical filter

J. Antoszewski, K. Winchester, A. Keating, T. Nguyen, K. K. M. B. D. Silva, H. Huang, C. Musca, J. Dell, L. Faraone, P. Mitra, J. Beck, M. Skokan, J. Robinson

Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.603519

KEYWORDS: Mirrors, Mercury cadmium telluride, Optical filters, Sensors, Microelectromechanical systems, Photoresistors, Short wave infrared radiation, Fabry–Perot interferometers, Infrared detectors, Silicon

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Showing 5 of 17 publications

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