Dr. Martin A. Hunt
Program Manager at Coherent Logix Inc
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Publications (18)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8063, Mobile Multimedia/Image Processing, Security, and Applications 2011
KEYWORDS: Clocks, Video acceleration, Data modeling, Video, Parallel processing, Computer programming, Video compression, Quantization, Parallel computing, Computer architecture

PROCEEDINGS ARTICLE | May 5, 2011
Proc. SPIE. 8050, Signal Processing, Sensor Fusion, and Target Recognition XX
KEYWORDS: Cameras, Sensors, Video, Computer programming, Video surveillance, Image filtering, Corner detection, Video processing, Parallel computing, Motion measurement

PROCEEDINGS ARTICLE | July 15, 2003
Proc. SPIE. 5041, Process and Materials Characterization and Diagnostics in IC Manufacturing
KEYWORDS: Image visualization, Holograms, Digital holography, Defect detection, Visualization, Inspection, Wavefronts, Scanning electron microscopy, Digital imaging, Semiconducting wafers

SPIE Conference Volume | May 22, 2003

PROCEEDINGS ARTICLE | May 22, 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Semiconductors, Holograms, Defect detection, Inspection, Fourier transforms, Wavefronts, Image registration, Wafer inspection, Optical alignment, Semiconducting wafers

PROCEEDINGS ARTICLE | July 12, 2002
Proc. SPIE. 4692, Design, Process Integration, and Characterization for Microelectronics
KEYWORDS: Beam splitters, Holograms, Holography, Digital holography, Deep ultraviolet, Spatial frequencies, Cameras, Fourier transforms, Digital video recorders, Semiconducting wafers

Showing 5 of 18 publications
Conference Committee Involvement (9)
Data Analysis and Modeling for Patterning Control III
23 February 2006 | San Jose, California, United States
Data Analysis and Modeling for Process Control II
3 March 2005 | San Jose, California, United States
Machine Vision Applications in Industrial Inspection XIII
17 January 2005 | San Jose, California, United States
Data Analysis and Modeling for Process Control
26 February 2004 | Santa Clara, California, United States
Machine Vision Applications in Industrial Inspection XII
21 January 2004 | San Jose, California, United States
Showing 5 of 9 published special sections
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