Maxime Templier
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 February 2021 Poster + Presentation + Paper
Proceedings Volume 11611, 116112G (2021) https://doi.org/10.1117/12.2582058
KEYWORDS: RGB color model, Semiconducting wafers, Statistical modeling, Metrology, Interferometry, Wafer-level optics, Reflectometry, Process control, Optical filters, Model-based design

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