Prof. Ryszard Kisiel
at Warsaw University of Technology
SPIE Involvement:
Conference Chair | Conference Program Committee | Editor | Author
Publications (8)

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Microsystems, Graphene, Sensors, Manufacturing, Electronic components, Photonics, Transistors, Integrated circuits, Field effect transistors, Analytical research

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Glasses, Particles, Copper, Ceramics, Silver, Resistance, Scanning electron microscopy, Diodes, Silicon carbide, Temperature metrology

SPIE Conference Volume | July 25, 2013

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006
KEYWORDS: Independent component analysis, Polymers, Metals, Particles, Copper, Silver, Manufacturing, Resistance, Epoxies, Adhesives

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006
KEYWORDS: Microscopes, Electrodes, Metals, Copper, Silver, Resistance, Humidity, Printed circuit board testing, Dendrites, Lead

PROCEEDINGS ARTICLE | April 26, 2006
Proc. SPIE. 6159, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV
KEYWORDS: Copper, Electrons, Silver, Resistance, Bismuth, Thermoelectric materials, Adhesives, Temperature metrology, Lead, Tin

Showing 5 of 8 publications
Conference Committee Involvement (2)
Electron Technology Conference 2013
16 April 2013 | Ryn, Poland
Laser Technology 2012: Applications of Lasers
24 September 2012 | Szczecin, Poland
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