Dr. Josep Nicolas
at SLAC National Accelerator Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (23)

PROCEEDINGS ARTICLE | June 14, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Scattering, X-rays, Crystals, Hard x-rays, Free electron lasers, Light sources, X-ray optics, Dynamic light scattering, Picosecond phenomena, Femtosecond phenomena, Light scattering

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Mirrors, Actuators, Metrology, X-rays, X-ray optics, Light sources, Spatial frequencies, Prototyping, Spatial resolution, Mechanics

PROCEEDINGS ARTICLE | October 27, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Mirrors, Free electron lasers, X-rays, Hard x-rays, Thermal effects, Grazing incidence, Liquid crystal lasers, Stanford Linear Collider, Computer aided design, Actuators

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical components, Optical alignment, Mirrors, Optics manufacturing, Mechanics, Optical design, Diagnostics, Spectral resolution, Tolerancing, Ray tracing

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Autocollimators, Mirrors, Denoising, X-ray optics, Laser beam diagnostics, Motion measurement, Nano opto mechanical systems, Time metrology, Data acquisition, Synchrotrons

PROCEEDINGS ARTICLE | September 30, 2013
Proc. SPIE. 8833, Tribute to H. John Caulfield
KEYWORDS: Fourier transforms, Spatial light modulators, RGB color model, Optical filters, Diffraction gratings, 3D image processing, Optical correlators, Oxygen, Optical signal processing, LCDs

Showing 5 of 23 publications
Conference Committee Involvement (3)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top