Dr. Haifeng Meng
at National Institute of Metrology
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Light sources, Metrology, Sensors, Calibration, Silicon, Quantum efficiency, Radiometry, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photovoltaics, Metrology, Einsteinium, Calibration, Solar cells, Capacitance, Transmittance, Analytical research, Laser optics, Temperature metrology

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics
KEYWORDS: Infrared cameras, Calibration

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Photovoltaics, Light sources, Metrology, Calibration, Solar cells, Error analysis, Silicon, Computer simulations, Spectral calibration, Laser optics

PROCEEDINGS ARTICLE | August 7, 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photovoltaics, Light sources, Metrology, Sensors, Calibration, Solar cells, Silicon, Solar radiation, Standards development, Light

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Light sources, Scattering, Calibration, Air contamination, Solar cells, Light scattering, Optical testing, Pollution, Rayleigh scattering, Electromagnetic scattering

Showing 5 of 12 publications
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