Prof. Jürgen W. Czarske
Professor of Measurement and Testing Technique at TU Dresden
SPIE Involvement:
Fellow status | Senior status | Conference Program Committee | Conference Chair | Author | Editor | Student Chapter Advisor
Area of Expertise:
Optoelectronic metrology , 3-dimensional shape measurements of high speed moving objects , laser-based turbulence and sound measurements in fluid flows , computational optics
Profile Summary

Jürgen Czarske is Professor of the Faculty of Electrical and Computer Engineering at TU Dresden, Germany.

Prof. Czarske studied Physics and Electrical Engineering, received the Ph.D. degrees (with highest honors) in Electrical and Mechanical Engineering in 1995 and the venia legendi (Dr.-Ing. habil.) in 2003, all from Gottfried Wilhelm Leibniz University of Hannover, Germany. After working for 9 years at LZH e.V. (Laser Center in Hannover) Prof. Czarske joined TU Dresden in 2004.

His technical activities and interest include:
1) Laser metrology based on optical interferometry and spectroscopy, e.g. in-process shape measurements; load investigations of composite materials; turbulence and sound measurements.
2) Computational optics, e.g. adaptive optics for turbulence research, digital holography, adaptive confocal microscopy and interferometry.

His service to technical community includes:
- Review Board on Measurement Systems at the colleague of Systems Engineering of German Re-search Foundation
- Member of the Editorial Board of the journal tm, Walter de Gruyter, Munich, Germany
- Chair of the conference of Laser and Optical Measurement Technology at International Sym-posium on Optoelectronic Technology and Application 2014, Beijing, China

Honors and awards include:
2013: Excellent paper, awarded at the 33th annual meeting of the Japan Laser Society, Tokyo, Japan
2011: ASME Turbo Expo (American Society of Mechanical Engineers), Best Paper Award on Con-trols, Diagnostics and Instrumentation, Vancouver, Canada
2009: Best Paper Award of the international OPTO conference, Nürnberg, Germany
2008:International Berthold Leibinger Innovation award, Ditzingen, Germany
2001: Highly commended article of Measurement Science and Technology, Bristol, United King-dom.
1996: Measurement technique prize of the society of university professors of measurement technique (AHMT), awarded at TU Munich, Germany
Publications (48)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Refractive index, Doppler effect, Cameras, Combustion, Interferometry, Optical testing, High speed cameras, Pixel resolution, Velocity measurements, Bragg cells

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Doppler effect, Speckle, Cameras, Sensors, Image processing, Light scattering, Interferometry, Structured optical fibers, Distance measurement, 3D metrology, Velocity measurements, Signal detection

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10335, Digital Optical Technologies 2017
KEYWORDS: Point spread functions, Aberration correction, Light sources, Microfluidics, Optical signal processing, Cameras, Video, Wavefronts, Deformable mirrors, Stereoscopic cameras, 3D metrology, Pollution control, Microfluidic imaging, Associative arrays, Illumination engineering, 3D image processing

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10335, Digital Optical Technologies 2017
KEYWORDS: Holograms, Holography, Digital holography, Silicon, Computer generated holography, Spatial light modulators, Optogenetics, Action potentials, Ferroelectric LCDs

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Data modeling, Doppler effect, Sensors, Calibration, Particles, Light scattering, Interferometry, Laser Doppler velocimetry, Distance measurement, Spatial resolution, Velocity measurements, Sensor calibration

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10335, Digital Optical Technologies 2017
KEYWORDS: Optical components, Microscopes, Luminescence, Adaptive optics, 3D metrology

Showing 5 of 48 publications
Conference Committee Involvement (10)
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Laser and Optical Measurement Technology
13 May 2014 | Beijing, China
Showing 5 of 10 published special sections
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