Dr. Péter Petrik
at CER
SPIE Involvement:
Profile Summary

Peter Petrik received his MSc and PhD degrees from the Technical University of Budapest in engineering and physics, respectively. He was a visiting scientist in Germany, in the USA and in the Netherlands for a total of more than five years in frame of different grants and projects. In 2012 and 2013 he worked in thin film metrology and scatterometry projects of the European Metrology Research Programme in Germany and the Netherlands.
He was the first winner of the Drude Award founded at the 4th International Conference of Spectroscopic Ellipsometry in 2007 for "exceptional contributions to the development and application of spectroscopic ellipsometry" in a range of applications including ion implanted and polycrystalline silicon. He received the prizes for young researchers and postdocs from the Hungarian Academy of Sciences and from the Research Institute for Technical Physics and Materials Science in 2000 and 2001, respectively.
His research involves the ellipsometric modeling of non-uniform, composite nanostructures including the development of ellipsometric models for the characterization of surface roughness, nanocrystalline semiconductors, photonic and organic structures. He also took part in the development of new concepts for ellipsometric hardware.
He has participated in more than 20 international and national research projects and has been collaborating with over 20 research groups worldwide in the past 15 years, coordinating and leading research groups in more than half of them. He has been the supervisor of 4 PhD and 7 MSc/BSc students. He has published 135 papers and 4 book chapters, held 21 oral (12 invited) presentations at international conferences.
Publications (16)

Proceedings Article | 18 March 2023 Presentation + Paper
Proceedings Volume 12395, 1239507 (2023) https://doi.org/10.1117/12.2649990
KEYWORDS: Proteins, Gold nanoparticles, Nickel, Sensors, Ellipsometry, Contamination, Scanning electron microscopy

Proceedings Article | 8 March 2023 Presentation + Paper
Berhane Nugusse, György Juhász, Csaba Major, Péter Petrik, Sándor Kálvin, Zoltán György Horváth, Miklós Fried
Proceedings Volume 12428, 124280H (2023) https://doi.org/10.1117/12.2649926
KEYWORDS: Polarization, Cameras, Silicon, Polarizers, Ellipsometry, Coded apertures, Reflection, Film thickness, Calibration, CMOS sensors

Proceedings Article | 8 March 2023 Presentation + Paper
D. Mukherjee, B. Kalas, S. Burger, G. Sáfrán, M. Serényi, M. Fried, P. Petrik
Proceedings Volume 12428, 124280S (2023) https://doi.org/10.1117/12.2649080
KEYWORDS: Silver, Aluminum, Plasmonics, Nanostructures, Interfaces, Gold, Metals, Silicon, Ellipsometry, Optical properties

Proceedings Article | 3 March 2022 Paper
Proceedings Volume 11977, 1197706 (2022) https://doi.org/10.1117/12.2609814
KEYWORDS: Silicon, Nanoparticles, Gold, Nanorods, Glasses, Particles, Plasmonics, Thin films, Semiconducting wafers, Silicon films

Proceedings Article | 2 March 2022 Poster + Paper
Proceedings Volume 11972, 119720G (2022) https://doi.org/10.1117/12.2609882
KEYWORDS: Gold, Glasses, Optical properties, Interfaces, Silicon, Refractive index, Nanoparticles, Thin films, Nanorods, Molecules

Showing 5 of 16 publications
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