CONFERENCE PROCEEDINGS
Advanced Search
Romain Jarnias
at CEA-Grenoble
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 25 March 2020 Paper
Block copolymer line roughness measurement via PSD: application to fingerprint samples
Aurélie Le Pennec, Jérôme Rêche, Patrick Quéméré, Guido Rademaker, Romain Jarnias, Charlotte Bouet, Célia Nicolet, Christophe Navarro, Maxime Argoud, Raluca Tiron
Proceedings Volume 11326, 113261I (2020) https://doi.org/10.1117/12.2551854
KEYWORDS: Line width roughness, Ultraviolet radiation, Edge detection, Polymethylmethacrylate, Directed self assembly, Binary data, Polymerization, Statistical analysis, Software development
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top