PROCEEDINGS VOLUME 1266
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 12-16 MARCH 1990
In-Process Optical Measurements and Industrial Methods
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
12-16 March 1990
The Hague, Netherlands
On-Line Optical Sensors Metrology and Alignment
Proc. SPIE 1266, On-line optical sensors for industrial material inspection, 0000 (1 August 1990); doi: 10.1117/12.20255
Proc. SPIE 1266, Locometer: on-line inspection of locomotive wheel to rail movements using high precision CCD metrology, 0000 (1 August 1990); doi: 10.1117/12.20256
Proc. SPIE 1266, Camber measurement in quality control of beryllia capillary tubes for argon ion lasers, 0000 (1 August 1990); doi: 10.1117/12.20257
Proc. SPIE 1266, Using an automatic video inspection system to guarantee in-line film registration, 0000 (1 August 1990); doi: 10.1117/12.20258
Materials and Spectroscopy
Proc. SPIE 1266, Magnetic and magneto-optical properties of bismuth-substituted gadolinium iron garnets, 0000 (1 August 1990); doi: 10.1117/12.20259
Proc. SPIE 1266, Broadband optical monitoring of filters fabricated using molecular beam deposition, 0000 (1 August 1990); doi: 10.1117/12.20260
Proc. SPIE 1266, Miniaturized FT-IR spectrometer for industrial process measurements, 0000 (1 August 1990); doi: 10.1117/12.20261
Proc. SPIE 1266, Semiconductor emitter based 32-channel spectrophotometer module for real-time process measurements, 0000 (1 August 1990); doi: 10.1117/12.20262
Proc. SPIE 1266, Rugged multiwavelength NIR and IR analyzers for industrial process measurements, 0000 (1 August 1990); doi: 10.1117/12.20263
Techniques Based on Optical Fibers
Proc. SPIE 1266, Measurement of vibration with low detection limit at audible frequencies, 0000 (1 August 1990); doi: 10.1117/12.34681
Proc. SPIE 1266, Safety of optical systems in hazardous areas, 0000 (1 August 1990); doi: 10.1117/12.20265
Proc. SPIE 1266, Non-invasive measurement of ion currents in plasma assisted processes using an optical fiber Faraday ring ammeter, 0000 (1 August 1990); doi: 10.1117/12.20266
Proc. SPIE 1266, In-situ film thickness monitoring in CVD and other thin film deposition processes, 0000 (1 August 1990); doi: 10.1117/12.20267
Interferometry, Surface Scattering, and Metrology
Proc. SPIE 1266, In-situ fiber interferometer for measuring quasi-conical diamond-turned surfaces, 0000 (1 August 1990); doi: 10.1117/12.20268
Proc. SPIE 1266, Interference pattern processing technique for optical phase measurement with applications in precision surface metrology, 0000 (1 August 1990); doi: 10.1117/12.20269
Proc. SPIE 1266, Deformation analysis of optical components for CO2-laser systems using holographic interferometry, 0000 (1 August 1990); doi: 10.1117/12.20270
Proc. SPIE 1266, Surface metrology by phase contrast, 0000 (1 August 1990); doi: 10.1117/12.20271
Proc. SPIE 1266, Microprofilometry using a spatial carrier frequency interferometrical technique, 0000 (1 August 1990); doi: 10.1117/12.20272
Proc. SPIE 1266, Light scattering method: inspection of diamond turning process, 0000 (1 August 1990); doi: 10.1117/12.20273
Surface Fabrication, Tools and Precision Machining
Proc. SPIE 1266, Influence of thermal expansion of the cutting tool on the workpiece accuracy during diamond turning, 0000 (1 August 1990); doi: 10.1117/12.20274
Proc. SPIE 1266, Optical surface fabrication on ultra precision machines, 0000 (1 August 1990); doi: 10.1117/12.20275
Proc. SPIE 1266, Generation of surface topology by interaction of vibration, spindle speed and feed velocity, 0000 (1 August 1990); doi: 10.1117/12.20276
Proc. SPIE 1266, Description of off-axis conic surfaces for nonaxizymmetric surface generation, 0000 (1 August 1990); doi: 10.1117/12.20277
Interferometry, Surface Scattering, and Metrology
Proc. SPIE 1266, Sensitivity enhancement in speckle metrology, 0000 (1 August 1990); doi: 10.1117/12.20278
Proc. SPIE 1266, Measurement of surface quality using a moire deflectometer, 0000 (1 August 1990); doi: 10.1117/12.20279
Surface Fabrication, Tools and Precision Machining
Proc. SPIE 1266, Ellipsometric study of the growing crystal face, 0000 (1 August 1990); doi: 10.1117/12.20280
Proc. SPIE 1266, Finish machining of optical surfaces, 0000 (1 August 1990); doi: 10.1117/12.20281
Plenary Paper
Proc. SPIE 1266, Some recent applications of electromagnetic theory in optics, 0000 (1 August 1990); doi: 10.1117/12.20282
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