Presentation + Paper
23 August 2021 ATHENA x-ray optics development and accommodation
Author Affiliations +
Abstract
The ATHENA (Advanced Telescope for High ENergy Astrophysics) mission studies and technology preparation are continuing to progress. The optics for this future space observatory is based on the Silicon Pore Optics (SPO), and is being evolved in a joint effort by industry, research institutions and ESA. The SPO technology uses the superb properties of monocrystalline Silicon, and spins in technologies developed for the semiconductor industry, benefiting from excellent materials, processes and equipment. In a holistic approach the technical and programmatic challenges of the ATHENA optics are being addressed simultaneously. A comprehensive Technology Development Plan (TDP) was defined and is being implemented to develop this novel X-ray optics technology. The performance, environmental compatibility and serial automated production and testing are being addressed in parallel, aiming at the demonstration of the required technology readiness for the Athena Mission Adopt ion Review (MAR) expected in 2022.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcos Bavdaz, Eric Wille, Mark Ayre, Ivo Ferreira, Brian Shortt, Sebastiaan Fransen, Mark Millinger, Maximilien J. Collon, Giuseppe Vacanti, Nicolas M. Barriere, Boris Landgraf, Mark Olde Riekerink, Jeroen Haneveld, Ronald Start, Coen van Baren, Desiree Della Monica Ferreira, Sonny Massahi, Sara Svendsen, Finn Christensen, Michael Krumrey, Evelyn Handick, Vadim Burwitz, Miranda Bradshaw, Giovanni Pareschi, Giuseppe Valsecchi, Dervis Vernani, Geeta Kailla, William Mundon, Gavin Phillips, Jakob Schneider, Tapio Korhonen, Alejandro Sanchez, Dominique Heinis, Carles Colldelram, Massimiliano Torti, and Richard Willingale "ATHENA x-ray optics development and accommodation", Proc. SPIE 11822, Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, 1182205 (23 August 2021); https://doi.org/10.1117/12.2594689
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KEYWORDS
Mirrors

X-ray optics

X-rays

Spatial resolution

Silicon

X-ray technology

Collimation

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