Prof. Armando Albertazzi Gonçalves
Professor/Head of Metrology Lab at Univ Federal de Santa Catarina
Publications (71)

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Optical components, Diffraction, General applications engineering, Speckle, Interferometers, Speckle pattern, Speckle interferometry, Shearography

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10376, Novel Optical Systems Design and Optimization XX
KEYWORDS: Diffractive optical elements, Interferometers, Composites, Inspection, Optical inspection, Shearography, Defect inspection

SPIE Conference Volume | July 18, 2017

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Endoscopy, Mirrors, Interferometers, Composites, Inspection, Analytical research, Shearography

SPIE Journal Paper | December 7, 2016
OE Vol. 55 Issue 12
KEYWORDS: Speckle, Metrology, Optical metrology, Image processing, Physics, Speckle metrology, Laser metrology, Interferometry, Nondestructive evaluation, Electrical engineering

SPIE Conference Volume | September 1, 2016

Showing 5 of 71 publications
Conference Committee Involvement (21)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 21 published special sections
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