Mr. John McElearney Profile

John McElearney

at Tufts Univ

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Publications (3)

Proceedings Article | 13 March 2024 Presentation

Iridium processing of metasurfaces for infrared optical applications

Zachary Kranefeld, T. Pan Menasuta, John McElearney, Victor Vazquez, Kevin Grossklaus, Thomas Vandervelde

Proceedings Volume PC12888, PC128880N (2024) https://doi.org/10.1117/12.3001949

KEYWORDS: Iridium, Infrared radiation, Reactive ion etching, Optics manufacturing, Scanning electron microscopy, Vacuum chambers, Thin films, Thin film deposition, Sputter deposition, Spectroscopic ellipsometry

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Proceedings Article | 11 March 2024 Poster + Paper

Determination of PMMA etch rates using VASE modeling

V. Vazquez, Z. Kranefeld, J. McElearney, T. Vandervelde

Proceedings Volume 12880, 128800T (2024) https://doi.org/10.1117/12.3002035

KEYWORDS: Etching, Polymethylmethacrylate, Argon, Data modeling, Silicon, Film thickness, Statistical modeling, Polarized light, Refractive index, Reflection

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Proceedings Article | 8 March 2024 Poster + Paper

Determination of optical constants of n- and p-type GaAs as a function of carrier concentration

Charles Dickerson, John McElearney, Kevin Grossklaus, Thomas Vandervelde

Proceedings Volume 12882, 128820R (2024) https://doi.org/10.1117/12.2692580

KEYWORDS: Gallium arsenide, Refractive index, Doping, Optical properties, Light absorption, Absorption, Reflection, Data modeling, Spectroscopic ellipsometry, Optoelectronics

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