Prof. Lianxiang Yang
SDL Author at Oakland Univ
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Chair | Journal Editorial Board Member | Author
Area of Expertise:
Interferometry , Photogrammetry , Optical measurement , Laser NDT
Websites:
Publications (46)

SPIE Journal Paper | July 13, 2018
OE Vol. 57 Issue 07
KEYWORDS: Digital image correlation, Injuries, Head, Optical spheres, Neck, Cameras, Optical engineering, Image processing, Spherical lenses, Baryon acoustic oscillations

SPIE Journal Paper | June 15, 2017
OE Vol. 56 Issue 06
KEYWORDS: Speckle pattern, Interferometry, Imaging systems, System integration, Cameras, Speckle, Interferometers, Aluminum

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Detection and tracking algorithms, Aerospace engineering, Cameras, Calibration, Manufacturing, Inspection, Optoelectronics, Corner detection, Reconstruction algorithms, Algorithms

SPIE Journal Paper | August 31, 2016
OE Vol. 55 Issue 09
KEYWORDS: Cameras, Silicon, Calibration, Vibrometry, Interferometers, Interferometry, Particles, Optical testing, Metrology, Packaging


SPIE Journal Paper | April 1, 2016
OE Vol. 55 Issue 09
KEYWORDS: Cameras, Speckle pattern, Interferometry, Digital image correlation, 3D metrology, Imaging systems, CCD cameras, Fourier transforms, CCD image sensors, Holograms

Showing 5 of 46 publications
Conference Committee Involvement (4)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Holography, Speckle Pattern Interferometry, and Applications
6 November 2011 | Beijing, Beijing, China
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