Prof. Song Zhang
Associate Professor at Purdue Univ
SPIE Involvement:
Scholarship Committee | Fellow status | Conference Chair | Conference Program Committee | Conference Co-Chair | Editor | Author
Area of Expertise:
high-speed 3D sensing , 3D optical metrology , 3D data analysis , high-speed 3D imaging , 3D video compression
Websites:
Profile Summary

Prof. Song Zhang is an associate professor of mechanical engineering at Purdue University. Previously, he was an assistant and associate professor of mechanical engineering at Iowa State University from 2008 to 2014. He received his Ph.D. degree in mechanical engineering from Stony Brook University in 2005. His major research interests are superfast 3-D optical sensing, 3D biophontic imaging, 3D geometry/video analysis, human and computer interaction, and virtual reality. Dr. Zhang has published over 100 research articles including more than 70 journal papers; edited one book; and holds 3 US patents. A number of his journal articles have been featured on their covers or highlighted by the journal societies. Dr. Zhang received the NSF CAREER award, Stony Brook University's 40 under Forty Alumni Awards, Iowa State University's Early Career Engineering Faculty Research Award, as others
Publications (70)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Image compression, Data storage, 3D metrology, Image storage, 3D image processing

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Fringe analysis, 3D metrology, Double patterning technology, Phase shifts

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Phase shifting, Error analysis, 3D modeling, 3D metrology, Phase measurement, Motion estimation, 3D image processing, Phase shifts

SPIE Journal Paper | September 28, 2017
OE Vol. 56 Issue 09
KEYWORDS: Cameras, Projection systems, Imaging systems, 3D image reconstruction, Reconstruction algorithms, Phase shifts, 3D image processing, Embedded systems, Calibration, 3D metrology

SPIE Journal Paper | July 6, 2017
OE Vol. 56 Issue 07
KEYWORDS: Binary data, Digital Light Processing, Projection systems, Optical testing, Projection devices, Fringe analysis

Showing 5 of 70 publications
Conference Committee Involvement (22)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
14 April 2019 | Baltimore, Maryland, United States
Emerging Digital Micromirror Device Based Systems and Applications XI
5 February 2019 | San Francisco, California, United States
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Interferometry XIX
21 August 2018 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Showing 5 of 22 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top