Dr. Roger Artigas
at Sensofar Tech SL
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Confocal microscopy, Microscopes, Monochromatic aberrations, Cameras, Calibration, Error analysis, 3D image processing

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
KEYWORDS: Microscopes, Diffraction, Optical transfer functions, Stars, Interferometers, Calibration, Manufacturing, 3D metrology, Objectives, Standards development

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Confocal microscopy, Microscopes, Sensors, Calibration, Microscopy, Image resolution, Interferometry, Distortion, Optical inspection, Time metrology, Image sensors, 3D metrology

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Image visualization, Defect detection, Visualization, Cameras, Microscopy, Inspection, Optical inspection, Process control, Objectives, Image classification, Binary data, Line scan image sensors

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10110, Photonic Instrumentation Engineering IV
KEYWORDS: Confocal microscopy, Microscopes, Photonic devices, Mirrors, Light sources, 3D imaging standards, Interferometers, Calibration, Phase interferometry, Optical fabrication, 3D metrology, Objectives, Optical interferometry, Standards development

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10110, Photonic Instrumentation Engineering IV
KEYWORDS: Confocal microscopy, Microscopes, Metrology, Cameras, Microscopy, Interfaces, Coating, Inspection, Interferometry, Optical inspection, 3D metrology, Objectives, Reflectance spectroscopy, 3D image processing

Showing 5 of 14 publications
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