Dr. Ivan Kassamakov
Ph. D., Researcher at University of Helsinki
SPIE Involvement:
Senior status | Author
Publications (32)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
KEYWORDS: Microscopes, Diffraction, Optical transfer functions, Stars, Interferometers, Calibration, Manufacturing, 3D metrology, Objectives, Standards development

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Optical spheres, Polarization, Scattering, Calibration, Glasses, Particles, Light scattering, Laser scattering, Polarizers, Scatter measurement

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Diffraction, Super resolution, Stereoscopy, Polymers, Image resolution, Near field scanning optical microscopy, 3D metrology, 3D vision, 3D image processing, Near field optics

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10451, Photomask Technology
KEYWORDS: Microscopes, MATLAB, Diffractive optical elements, Modulation, Photoresist materials, 3D metrology, Photomasks, Source mask optimization, Semiconducting wafers, Multiphoton lithography

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Linear polarizers, Optical spheres, Polarization, Scattering, Calibration, Particles, Photomultipliers, Light scattering, Wave plates, Polarimetry, Scatterometry, Mie scattering, Statistical modeling, Inverse optics

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Linear polarizers, Tunable lasers, Calibration, Particles, Photomultipliers, Light scattering, Polarizers, Optical testing, Spherical lenses, Scatter measurement, Particle systems

Showing 5 of 32 publications
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