Prof. Younghun Yu
Professor at Jeju National Univ
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | February 1, 2011
OE Vol. 50 Issue 02
KEYWORDS: Charge-coupled devices, Molybdenum, Digital holography, Holography, Holograms, Microscopes, 3D image reconstruction, 3D metrology, Optical engineering, 3D image processing

PROCEEDINGS ARTICLE | October 16, 2007
Proc. SPIE. 6778, Three-Dimensional TV, Video, and Display VI
KEYWORDS: Microscopes, Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, CCD cameras, Objectives, Charge-coupled devices, Digital recording

PROCEEDINGS ARTICLE | July 28, 1997
Proc. SPIE. 3096, Photomask and X-Ray Mask Technology IV
KEYWORDS: Scattering, Quartz, Sputter deposition, Polymers, Error analysis, Photomasks, Analytical research, Critical dimension metrology, Statistical methods, Semiconducting wafers

PROCEEDINGS ARTICLE | July 7, 1997
Proc. SPIE. 3051, Optical Microlithography X
KEYWORDS: Diffraction, Image quality, Semiconducting wafers

PROCEEDINGS ARTICLE | February 12, 1997
Proc. SPIE. 3236, 17th Annual BACUS Symposium on Photomask Technology and Management
KEYWORDS: Optical lithography, Cadmium, Error analysis, Manufacturing, Printing, Photomasks, Raster graphics, Critical dimension metrology, Semiconducting wafers, X-ray lithography

PROCEEDINGS ARTICLE | February 12, 1997
Proc. SPIE. 3236, 17th Annual BACUS Symposium on Photomask Technology and Management
KEYWORDS: Lithography, Electron beam lithography, Scattering, Computer simulations, Monte Carlo methods, Photomasks, Optical simulations, Beam shaping, Algorithm development, Photoresist processing

Showing 5 of 6 publications
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