PROCEEDINGS VOLUME 7102
OPTICAL SYSTEMS DESIGN | 2-5 SEPTEMBER 2008
Optical Fabrication, Testing, and Metrology III
Proceedings Volume 7102 is from: Logo
OPTICAL SYSTEMS DESIGN
2-5 September 2008
Glasgow, Scotland, United Kingdom
Front Matter
Proc. SPIE 7102, Front Matter: Volume 7102, 710201 (15 October 2008); doi: 10.1117/12.817248
Nano- and Microstructures and Elements
Proc. SPIE 7102, Nanostructured optical fibre for surface-enhanced Raman scattering sensing, 710202 (24 September 2008); doi: 10.1117/12.797582
Proc. SPIE 7102, Localized measurements of optical thickness variations in femtosecond trimmed structures, 710203 (25 September 2008); doi: 10.1117/12.797415
Proc. SPIE 7102, Phase and amplitude interferometric characterization of infrared nanostructured gratings, 710204 (25 September 2008); doi: 10.1117/12.797410
Proc. SPIE 7102, Tunable liquid microlens array driven by pyroelectric effect: full interferometric characterization, 710205 (25 September 2008); doi: 10.1117/12.797695
Proc. SPIE 7102, Computer generated holograms: fabrication and application for precision optical testing, 710206 (25 September 2008); doi: 10.1117/12.797816
Proc. SPIE 7102, Development of a goniometric light scatter instrument with sample imaging ability, 710207 (25 September 2008); doi: 10.1117/12.797621
Proc. SPIE 7102, Dynamic x-ray lithography for blazed diffractive optics fabrication, 710208 (25 September 2008); doi: 10.1117/12.797728
Proc. SPIE 7102, Profilometric characterization of DOEs with continuous microrelief, 710209 (25 September 2008); doi: 10.1117/12.797673
Aspheric and Complex Surfaces
Proc. SPIE 7102, Design for test and manufacture of complex multi-component optical instruments, 71020A (25 September 2008); doi: 10.1117/12.797680
Proc. SPIE 7102, Surface quality of a 1m Zerodur part using an effective grinding mode, 71020B (25 September 2008); doi: 10.1117/12.797451
Proc. SPIE 7102, Metal mirrors with excellent figure and roughness, 71020C (25 September 2008); doi: 10.1117/12.797702
Proc. SPIE 7102, Aspherical manufacturing in terms of accuracy, efficiency, and surface forms based on practical experiences, 71020D (25 September 2008); doi: 10.1117/12.799487
Proc. SPIE 7102, Ion beam manufacturing of a graded-phase mirror for the generation of square "top hat" laser beams, 71020E (25 September 2008); doi: 10.1117/12.797629
Proc. SPIE 7102, Finish assessment of complex surfaces by advanced light scattering techniques, 71020F (25 September 2008); doi: 10.1117/12.797964
Proc. SPIE 7102, Applications and benefits of "perfectly bad" optical surfaces, 71020G (25 September 2008); doi: 10.1117/12.797718
Proc. SPIE 7102, Modeling of the polishing process for aspheric optics, 71020H (25 September 2008); doi: 10.1117/12.796388
Proc. SPIE 7102, Wave front related surface form tolerances for manufacturing higher grade optical components, 71020I (26 September 2008); doi: 10.1117/12.797722
Invited Session: Standards, Accuracy, and Limitations
Proc. SPIE 7102, Laser beam homogenizing: limitations and constraints, 71020J (25 September 2008); doi: 10.1117/12.799400
Proc. SPIE 7102, Digital cameras: optical footprints in a performance metric, 71020K (25 September 2008); doi: 10.1117/12.790891
Proc. SPIE 7102, Optical glasses and optical elements: comparison of specification standards ISO DIS 12123 and ISO 10110, 71020L (25 September 2008); doi: 10.1117/12.797568
Proc. SPIE 7102, Optical roughness measurements on specially designed roughness standards, 71020M (25 September 2008); doi: 10.1117/12.798729
Systems and Components I
Proc. SPIE 7102, Model and simulation of fringe projection measurements as part of an assistance system for multi-component fringe projection sensors, 71020N (25 September 2008); doi: 10.1117/12.797600
Proc. SPIE 7102, Assembly and integration of optical systems for space applications, 71020O (25 September 2008); doi: 10.1117/12.797602
Proc. SPIE 7102, Experience using a double pass Shack-Hartmann set-up on a DUV high NA high performance lens, 71020P (25 September 2008); doi: 10.1117/12.797726
Proc. SPIE 7102, Intraocular lens characterization using a quadric-wave lateral shearing interferometer wave front sensor, 71020Q (25 September 2008); doi: 10.1117/12.797682
Proc. SPIE 7102, Test images of a sector star versus radial and axial merit functions, 71020R (25 September 2008); doi: 10.1117/12.797617
Material and Thin Film Properties
Proc. SPIE 7102, Automating spectral measurements, 71020S (25 September 2008); doi: 10.1117/12.797562
Proc. SPIE 7102, Characterization of high reflecting coatings and optical materials by direct absorption and cavity ring down measurements, 71020T (25 September 2008); doi: 10.1117/12.797679
Proc. SPIE 7102, Characterizations of UV-laser damage on fused silica surfaces, 71020U (25 September 2008); doi: 10.1117/12.797407
Proc. SPIE 7102, Ray tracing approach to refractive index measurement of prism samples in a vacuum cell, 71020V (25 September 2008); doi: 10.1117/12.797424
Proc. SPIE 7102, Dispersion and temperature dependence of thermo-optic coefficients of optical materials over their whole transparency range: vectorial formalism and application to KTiOPO4, 71020W (25 September 2008); doi: 10.1117/12.804722
Systems and Components II
Proc. SPIE 7102, Interferometrical testing of parabolic mirrors with diffracted spherical wavefront, 71020X (25 September 2008); doi: 10.1117/12.797391
Special Techniques
Proc. SPIE 7102, Ultrafine measurements of the thermal shift of Fabry-Perot resonances, 71020Y (25 September 2008); doi: 10.1117/12.797710
Proc. SPIE 7102, Optical compensation of macroscopical surface curvature in rough surface scatterometry, 71020Z (25 September 2008); doi: 10.1117/12.799065
Proc. SPIE 7102, Optical inspection of micro-electromechanical systems, 710210 (26 September 2008); doi: 10.1117/12.797559
Proc. SPIE 7102, Fourier transform evaluation and numerical modeling of fluid flow in a Laval nozzle, 710211 (25 September 2008); doi: 10.1117/12.797979
Proc. SPIE 7102, Vortex polarimetry, 710212 (25 September 2008); doi: 10.1117/12.797551
Poster Session
Proc. SPIE 7102, Investigation of an automated cleaning system for LMJ coating sol-gel process, 710214 (25 September 2008); doi: 10.1117/12.797445
Proc. SPIE 7102, Polishing and testing of the 3.5 m SiC M1 mirror of the Herschel space observatory of ESA, 710218 (25 September 2008); doi: 10.1117/12.797645
Proc. SPIE 7102, Polishing and testing of the 1.5 m SiC M1 mirror of the ALADIN instrument on the ADM-Aeolus satellite of ESA, 710219 (25 September 2008); doi: 10.1117/12.797730
Proc. SPIE 7102, Error behaviour in differential phase-shifting algorithms, 71021B (25 September 2008); doi: 10.1117/12.797975
Proc. SPIE 7102, Spectral measurement in reflection on steeply aspheric surfaces, 71021C (25 September 2008); doi: 10.1117/12.804721
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