Dr. Bernd H. Kleemann
Staff Scientist at Carl Zeiss AG
SPIE Involvement:
Publications (12)

Proceedings Article | 27 September 2016 Paper
Markus Seesselberg, Bernd Kleemann, Johannes Ruoff
Proceedings Volume 9953, 995306 (2016) https://doi.org/10.1117/12.2236604
KEYWORDS: Diffractive optical elements, Ray tracing, Far-field diffraction, Diffraction gratings, Computer generated holography, Geometrical optics, Optical design software, Refraction, Far-field diffraction, Diffraction, Refractive index

Proceedings Article | 23 September 2015 Paper
Proceedings Volume 9630, 96300Q (2015) https://doi.org/10.1117/12.2192517
KEYWORDS: Diffraction gratings, Diffraction, Interfaces, Matrices, Scattering, Electromagnetism, Computer generated holography, Digital holography, Polarization, Optical simulations

Proceedings Article | 13 May 2013 Paper
Oliver Paul, Frank Widulle, Bernd Kleemann, Andreas Heinrich
Proceedings Volume 8788, 87881O (2013) https://doi.org/10.1117/12.2020880
KEYWORDS: Metrology, Data modeling, Error analysis, Scattering, Light scattering, Scatterometry, Model-based design, Silicon, Computer simulations, 3D modeling

Proceedings Article | 23 May 2011 Paper
Proceedings Volume 8083, 808309 (2011) https://doi.org/10.1117/12.889364
KEYWORDS: Finite element methods, Diffraction, Maxwell's equations, Error analysis, Diffraction gratings, Inverse scattering, Scattering, Electromagnetism, Electromagnetic scattering, Polarization

Proceedings Article | 9 September 2010 Paper
Markus Seesselberg, Bernd Kleemann
Proceedings Volume 7652, 76522T (2010) https://doi.org/10.1117/12.869548
KEYWORDS: Diffraction, Diffractive optical elements, Electromagnetism, Electromagnetic simulation, Stray light, Head-mounted displays, Photographic lenses, Manufacturing, Optical design, Chromatic aberrations

Showing 5 of 12 publications
Conference Committee Involvement (6)
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Modeling Aspects in Optical Metrology
23 May 2011 | Munich, Germany
Modeling Aspects in Optical Metrology
15 June 2009 | Munich, Germany
Showing 5 of 6 Conference Committees
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