Dr. Eunpa Kim
at Samsung Electronics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Poster
Proceedings Volume 12955, 129552U (2024) https://doi.org/10.1117/12.3010488
KEYWORDS: Semiconducting wafers, High volume manufacturing, Metrology, Copper, Chemical mechanical planarization, Surface finishing, Semiconductor manufacturing, Process control, Miniaturization, Atomic force microscopy

Proceedings Article | 27 April 2023 Presentation + Paper
Proceedings Volume 12496, 124961H (2023) https://doi.org/10.1117/12.2658638
KEYWORDS: Semiconductor manufacturing, Inspection, Image classification, Scanning electron microscopy, Deep learning, Semiconductors, Classification systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top