Dr. Daniele Cocco Profile

Dr. Daniele Cocco

R&D Engineering Physicist at SLAC National Accelerator Lab

SPIE Involvement:

Conference Program Committee | Conference Chair | Author | Editor

Publications (35)

PROCEEDINGS ARTICLE | October 3, 2017

Status of the metrology laboratory for the LCLS II project (Conference Presentation)

Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII

KEYWORDS: Mirrors, Metrology, Interferometers, Interferometry, Head, Autocollimators, Profilometers, Prototyping, Mirror stabilization, Liquid crystal lasers

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PROCEEDINGS ARTICLE | September 19, 2017

REAL cooled mirror for FEL application: FEA modelling and wavefront propagation simulation (Conference Presentation)

Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII

KEYWORDS: Optical components, Modeling, Mirrors, X-ray optics, X-rays, Wavefronts, Wave propagation, Finite element methods, Free electron lasers, Prototyping

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SPIE Conference Volume | November 14, 2016

8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

PROCEEDINGS ARTICLE | November 2, 2016

Design of a multipurpose mirror system for LCLS-2 photon transport studies (Conference Presentation)

Proc. SPIE. 9965, Adaptive X-Ray Optics IV

KEYWORDS: Cooling systems, Actuators, Mirrors, X-rays, Superconductors, Wavefronts, Optical fabrication, Synchrotrons, Free electron lasers, Photon transport

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PROCEEDINGS ARTICLE | November 2, 2016

Wavefront sensor based diagnostic of FERMI FEL photon beam (Conference Presentation)

Proc. SPIE. 9965, Adaptive X-Ray Optics IV

KEYWORDS: Diffraction, Mirrors, X-ray optics, Imaging systems, Sensors, Diagnostics, Wavefront sensors, Wavefronts, Wave propagation, Free electron lasers

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FERMI is the first seeded EUV-SXR free electron laser (FEL) user facility, and it is operated at Elettra Sincrotrone Trieste. Two of the four already operating beamlines, namely LDM (Low Density Matter) and DiProI (Diffraction and Projection Imaging), use a Kirkpatrick-Baez (K-B) active X-ray optics system for focusing the FEL pulses onto the target under investigation. A wafefront sensor is used as diagnostic for the characterization of the focused spot and for the optimization of the parameters of these active optical systems as well. The aim of this work is, first, to describe in detail the optimization procedure using the wavefront sensor through the minimization of the Zernike coefficients, and second, report on the final results obtained on the K-B optical system at the DiProI endstation. The wavefront sensor, mounted out of focus behind the DiProI chamber, allows to compute the intensity distribution of the FEL beam, typically a mix between several modes resulting in a ”noisy hyper-Gaussian” intensity profile, and the wavefront residual from ideal propagation shape and after tilt correction. Combining these two measures we can obtain the electric field of the wave out of focus. Propagating back the electric field we reconstruct the focal spot in far field approximation. In this way the sensor works as a diagnostic reconstructing the focal spot. On the other hand, after modelling the electric field with a Zernike polynomial it is easy and fast to optimize the mirror bending and the optical system angles by minimizing the aberrations, quantified in terms of Zernike coefficients. Since each coefficient corresponds to a single parameter, they can be minimized one at the time. Online wavefront measurements have made possible the optimization of the bending acting on the mirror curvature, and of the (pitch and roll) angle positions of the K-B system. From the wavefront measurements we have inferred a focal spot for DiProI of 5.5 μm x 6.2 μm at 32 nm wavelength, confirmed by the PMMA ablation imprints. The experimental results were compared with the predictions from simulations obtained using the WISE code, starting from the characterization of the actual mirror surface metrology. The results from simulations were found to be in agreement with the experimental measurements.

PROCEEDINGS ARTICLE | October 27, 2016

Optimizing x-ray mirror thermal performance using variable length cooling for second generation FELs

Proc. SPIE. 9965, Adaptive X-Ray Optics IV

KEYWORDS: Actuators, Mirrors, X-rays, Thermal effects, Computer aided design, Grazing incidence, Hard x-rays, Free electron lasers, Stanford Linear Collider, Liquid crystal lasers

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PROCEEDINGS ARTICLE | September 17, 2014

Status of the K-B bendable optics at FERMI@Elettra FEL

Proc. SPIE. 9208, Adaptive X-Ray Optics III

KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Metrology, Polymethylmethacrylate, Imaging systems, Wavefront sensors, Wavefronts, Free electron lasers

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FERMI is the first seeded EUV-SXR free electron laser (FEL) user facility operated at Elettra Sincrotrone Trieste. Two of the three already operating beamlines, namely LDM (Low DensityMatter) and DiProI (Diffraction and Projection Imaging), use a Kirkpatrick-Baez (K-B) active X-ray optics system for focusing the FEL pulses onto the target under investigation. The present work reports on the final results obtained from the optimization of the K-B optical system at the DiProI endstation. The aim of the optimization is to improve the system performances in terms of quality and size of the focal spot onto the sample, controlling the fluence as well. To characterize the performances and develop reliable and reproducible focusing procedures we performed a campaign of measurements with several diagnostic systems, including a wavefront sensor mounted after the DiProI chamber. Online wavefront measurements have made possible the optimization of the bending acting on the mirror curvature and of the (pitch and roll) angle positions of the K-B system. From the wavefront measurements we have inferred a focal spot of 8 μm x 9.5 μm, confirmed by the PMMA ablation imprints. The experimental results are compared with the predictions from simulations obtained using the WISE code, starting from the characterization of the actual mirror surface metrology. The results from simulations are in agreement with the experimental measurements. Filtering the Fourier transform of the mirror surface profiles, using the WISE code we have analyzed the impact of different spatial wavelengths on the focal spot degradation. For different energies of the incident beam we established the threshold where the focal spot degradation is no longer affected by the spatial wavelengths of the K-B mirror surfaces. In the very last period we were starting to observe a degradation of the focal spot. After a metrology analysis we concluded that the problem was due to a failure of the substrate material. We temporally solved the problem checking the mounting, but we have planned an improvement of the material for the future.

PROCEEDINGS ARTICLE | September 30, 2013

The optical design of the soft x-ray self-seeding at LCLS

Proc. SPIE. 8849, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X

KEYWORDS: Diffraction, Mirrors, Optical design, Electron beams, X-rays, Spectral resolution, Monochromators, Free electron lasers, Liquid crystal lasers, Diffraction gratings

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PROCEEDINGS ARTICLE | September 27, 2013

K-B bendable system optimization at FERMI@Elettra FEL: impact of different spatial wavelengths on the spot size

Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII

KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Polymethylmethacrylate, Wavefront sensors, Wavefronts, Computer simulations, Atomic force microscopy, Free electron lasers

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PROCEEDINGS ARTICLE | October 19, 2012

An active optics system for EUV/soft x-ray beam shaping

Proc. SPIE. 8503, Adaptive X-Ray Optics II

KEYWORDS: Actuators, Mirrors, Metrology, Interferometers, X-rays, Resistance, Wavelength division multiplexing, Beam shaping, Active optics, Free electron lasers

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PROCEEDINGS ARTICLE | October 15, 2012

The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results

Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

KEYWORDS: Mirrors, Electron beams, Modulation, Spectroscopy, Diagnostics, Modulators, YAG lasers, Beam propagation method, Free electron lasers, Photon transport

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PROCEEDINGS ARTICLE | October 15, 2012

Cross comparison of surface slope and height optical metrology with a super-polished plane Si mirror

Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV

KEYWORDS: Mirrors, Light sources, X-ray optics, Metrology, Interferometers, Calibration, X-rays, Silicon, Optical metrology, Free electron lasers

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PROCEEDINGS ARTICLE | September 28, 2011

Characterization of the FERMI@Elettra's on-line photon energy spectrometer

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Energy efficiency, Diffraction, Metrology, Spatial frequencies, Sensors, Spectroscopy, X-rays, Diagnostics, Free electron lasers, Diffraction gratings

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PROCEEDINGS ARTICLE | May 21, 2011

Delay systems and phase retarders based on multilayers coated mirrors for FEL beam manipulation

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Optical components, Mirrors, Multilayers, Beam splitters, Polarization, Polarizers, Wave plates, Free electron lasers, Phase shifts, Light

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PROCEEDINGS ARTICLE | May 21, 2011

Multilayer mirrors for FERMIatELETTRA beam transport system

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Mirrors, Multilayers, X-ray optics, Optical coatings, Reflectivity, Wavefronts, Extreme ultraviolet, Monochromators, Free electron lasers, Iridium

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PROCEEDINGS ARTICLE | May 21, 2011

First results from the commissioning of the FERMI@Elettra free electron laser by means of the Photon Analysis Delivery and Reduction System (PADReS)

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Mirrors, Visible radiation, Safety, Spectroscopy, Diagnostics, Photonics systems, Beam propagation method, Pulsed laser operation, Free electron lasers, Photon transport

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PROCEEDINGS ARTICLE | May 19, 2011

Probing matter under extreme conditions at Fermi@Elettra: the TIMEX beamline

Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III

KEYWORDS: Ultrafast phenomena, Optical filters, Mirrors, Sensors, X-rays, Electrons, Aluminum, Free electron lasers, Condensed matter, Absorption

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SPIE Conference Volume | May 18, 2011

Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

PROCEEDINGS ARTICLE | September 9, 2009

A fixed included angle monochromator for the 4th generation light source at FERMI@Elettra

Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV

KEYWORDS: Diffraction, Mirrors, Optical design, Light sources, Manufacturing, Wavefronts, Monochromators, Spherical lenses, Free electron lasers, Diffraction gratings

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PROCEEDINGS ARTICLE | May 18, 2009

The FERMI@Elettra FEL photon transport system

Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II

KEYWORDS: Mirrors, Multilayers, Safety, Coating, Reflectivity, Wavefronts, Monochromators, Free electron lasers, Camera shutters, Photon transport

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PROCEEDINGS ARTICLE | September 17, 2005

First report on a European round robin for slope measuring profilers

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, X-ray optics, Metrology, Nano opto mechanical systems, Interferometers, Sensors, Calibration, Error analysis, Head, Spherical lenses

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PROCEEDINGS ARTICLE | September 17, 2005

On the choice of a metrological instrument for synchrotron radiation optics

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Optical components, Mirrors, Metrology, Optical spheres, Interferometers, Ultraviolet radiation, Photons, Wavefronts, Synchrotron radiation, Spherical lenses

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PROCEEDINGS ARTICLE | September 17, 2005

A second optic head for the ELETTRA long trace profiler

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, Beam splitters, Optical spheres, Interferometers, Sensors, Calibration, Ocean optics, Head, Charge-coupled devices, Neodymium

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PROCEEDINGS ARTICLE | September 10, 2005

A plane grating with single-layer coating for the sub-nanometer wavelength range

Proc. SPIE. 5918, Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II

KEYWORDS: Gold, Microscopes, Diffraction, Mirrors, Etching, X-rays, Silicon, Coating, Monochromators, Diffraction gratings

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PROCEEDINGS ARTICLE | December 24, 2002

Kirkpatrick-Baez elliptical bendable mirrors at the nanospectroscopy beamline: metrological results and x-ray performance

Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II

KEYWORDS: Actuators, Microscopes, Mirrors, X-ray optics, Polishing, Metrology, X-rays, Monochromators, Grazing incidence, Nanospectroscopy

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PROCEEDINGS ARTICLE | December 24, 2002

Temperature-dependence perturbations on LTP measurements

Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II

KEYWORDS: Thermography, Optical components, Mirrors, Metrology, Phase modulation, Control systems, Head, Turbulence, Synchrotron radiation, Temperature metrology

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PROCEEDINGS ARTICLE | December 20, 2001

Multipurpose experimental station for soft x-ray microscopy on BACH beamline at Elettra

Proc. SPIE. 4506, Soft X-Ray and EUV Imaging Systems II

KEYWORDS: Microscopes, Mirrors, Polarization, Sensors, X-rays, X-ray microscopy, Spectral resolution, Monochromators, Signal detection, Absorption

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PROCEEDINGS ARTICLE | December 20, 2001

ComIXS: a compact inelastic x-ray spectrometer

Proc. SPIE. 4506, Soft X-Ray and EUV Imaging Systems II

KEYWORDS: Sensors, Spectroscopy, Luminescence, Photons, X-rays, Spectral resolution, Charge-coupled devices, Spatial resolution, Spherical lenses, Diffraction gratings

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Soft x-ray emission spectroscopy is a well established technique, which has seen increased interest in recent years due to the development of high brilliance synchrotron radiation facilities. Emission spectra are obtained when a hole is created by impinging photons, and an electron from the valence band decays into the core hole emitting its excess energy radiatively. The fluorescence yield is intrinsically low in the range of soft x-rays, usually less than about 0.5%, since the most probable decay channels are radiationless channels like Coster Kronig and Auger processes. Emission is over all space, but only a restricted solid angle can be collected and this further reduces the efficiency of the instrumentation. Moreover, the emitted photons must be energy selected, and this involves the use of soft x-ray monochromators with good resolving power. We designed a photon spectrometer to be located in the experimental chamber of one of ELETTRA's beamlines (BACH) to perform inelastic X-ray scattering measurement in the energy range 20-1200 eV with relatively high resolving power (above 2000 in most of the range). The spectrometer is based on two interchangeable mechanically ruled spherical VLS gratings with blaze profile of the grooves. The diffracted photons are collected by a back illuminated CCD of 1300X1340 pixels, each of 20X20 micrometers ² dimension. The two interchangeable gratings are inserted in or removed from the beam by manual translation and are kept fixed during the measurement. The energy scan (or selection) is made by a mono-dimensional translation of the CCD. To cover the whole energy range, including the zero order light, only a small movement (about 7 cm of linear translation) of the detector is necessary. No detector rotation or bi-dimensional displacement is needed. Since the size of the CCD is quite large, it is possible to collect, in a single shot, a very large photon energy window, about 20-30% of the full energy range of each grating. The optical layout and the expected performances are reported.

PROCEEDINGS ARTICLE | November 14, 2001

Synchrotron radiation optics: quality demands and technical achievability

Proc. SPIE. 4501, X-Ray Mirrors, Crystals, and Multilayers

KEYWORDS: Optical components, Mirrors, Metrology, Interferometers, Error analysis, Surface roughness, Optical testing, Synchrotron radiation, Spherical lenses, Optics manufacturing

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PROCEEDINGS ARTICLE | January 5, 2001

Study of clamping-induced deformations on SR optics by means of LTP

Proc. SPIE. 4145, Advances in X-Ray Optics

KEYWORDS: Optical components, Mirrors, X-ray optics, Copper, Distortion, Spectral resolution, Synchrotron radiation, Monochromators, Spherical lenses, Optics manufacturing

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PROCEEDINGS ARTICLE | November 8, 2000

High-precision measurements of the groove density of diffraction gratings

Proc. SPIE. 4146, Soft X-Ray and EUV Imaging Systems

KEYWORDS: Diffraction, Mirrors, Sensors, X-rays, Fourier transforms, Detector arrays, Head, Synchrotron radiation, Spherical lenses, Diffraction gratings

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PROCEEDINGS ARTICLE | November 8, 2000

Optical layout of BACH: a beamline for advanced dichroism at Elettra

Proc. SPIE. 4146, Soft X-Ray and EUV Imaging Systems

KEYWORDS: Gold, Optical components, Monochromatic aberrations, Mirrors, Scattering, X-rays, Silicon, Spectral resolution, Monochromators, Spherical lenses

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PROCEEDINGS ARTICLE | November 23, 1999

Microfocusing VLS-grating-based beamline for advanced microscopy

Proc. SPIE. 3767, EUV, X-Ray, and Neutron Optics and Sources

KEYWORDS: Microscopes, Mirrors, X-ray optics, Microscopy, X-rays, Solids, Spectral resolution, Monochromators, Grazing incidence, Spherical lenses

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PROCEEDINGS ARTICLE | September 6, 1999

Metrological challenges of synchrotron radiation optics

Proc. SPIE. 3739, Optical Fabrication and Testing

KEYWORDS: Mirrors, X-ray optics, Metrology, Interferometers, Calibration, Photons, Laser induced plasma spectroscopy, Synchrotron radiation, Grazing incidence, Spherical lenses

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PROCEEDINGS ARTICLE | September 24, 1998

Design and comparison of two photon spectrometers for soft x-ray emission spectroscopy

Proc. SPIE. 3450, Theory and Practice of Surface-Relief Diffraction Gratings: Synchrotron and Other Applications

KEYWORDS: Energy efficiency, Optical design, Scattering, Sensors, X-rays, Spectrometers, Emission spectroscopy, Spectral resolution, Monochromators, Spherical lenses

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