Dr. Daniele Cocco Profile

Dr. Daniele Cocco

R&D Engineering Physicist at SLAC National Accelerator Lab

SPIE Involvement:

Conference Program Committee | Conference Chair | Editor | Author

Publications (31)

SPIE Conference Volume | November 14, 2016

8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics

PROCEEDINGS ARTICLE | October 27, 2016

Optimizing x-ray mirror thermal performance using variable length cooling for second generation FELs

Proc. SPIE. 9965, Adaptive X-Ray Optics IV

KEYWORDS: Mirrors, Free electron lasers, X-rays, Hard x-rays, Thermal effects, Grazing incidence, Liquid crystal lasers, Stanford Linear Collider, Computer aided design, Actuators

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PROCEEDINGS ARTICLE | September 17, 2014

Status of the K-B bendable optics at FERMI@Elettra FEL

Proc. SPIE. 9208, Adaptive X-Ray Optics III

KEYWORDS: Mirrors, Free electron lasers, Diffraction, Wavefronts, Polymethylmethacrylate, Point spread functions, Wavefront sensors, Imaging systems, Metrology, X-ray optics

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FERMI is the first seeded EUV-SXR free electron laser (FEL) user facility operated at Elettra Sincrotrone Trieste. Two of the three already operating beamlines, namely LDM (Low DensityMatter) and DiProI (Diffraction and Projection Imaging), use a Kirkpatrick-Baez (K-B) active X-ray optics system for focusing the FEL pulses onto the target under investigation. The present work reports on the final results obtained from the optimization of the K-B optical system at the DiProI endstation. The aim of the optimization is to improve the system performances in terms of quality and size of the focal spot onto the sample, controlling the fluence as well. To characterize the performances and develop reliable and reproducible focusing procedures we performed a campaign of measurements with several diagnostic systems, including a wavefront sensor mounted after the DiProI chamber. Online wavefront measurements have made possible the optimization of the bending acting on the mirror curvature and of the (pitch and roll) angle positions of the K-B system. From the wavefront measurements we have inferred a focal spot of 8 μm x 9.5 μm, confirmed by the PMMA ablation imprints. The experimental results are compared with the predictions from simulations obtained using the WISE code, starting from the characterization of the actual mirror surface metrology. The results from simulations are in agreement with the experimental measurements. Filtering the Fourier transform of the mirror surface profiles, using the WISE code we have analyzed the impact of different spatial wavelengths on the focal spot degradation. For different energies of the incident beam we established the threshold where the focal spot degradation is no longer affected by the spatial wavelengths of the K-B mirror surfaces. In the very last period we were starting to observe a degradation of the focal spot. After a metrology analysis we concluded that the problem was due to a failure of the substrate material. We temporally solved the problem checking the mounting, but we have planned an improvement of the material for the future.

PROCEEDINGS ARTICLE | September 30, 2013

The optical design of the soft x-ray self-seeding at LCLS

Proc. SPIE. 8849, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X

KEYWORDS: Mirrors, X-rays, Monochromators, Optical design, Electron beams, Free electron lasers, Diffraction gratings, Diffraction, Spectral resolution, Liquid crystal lasers

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PROCEEDINGS ARTICLE | September 27, 2013

K-B bendable system optimization at FERMI@Elettra FEL: impact of different spatial wavelengths on the spot size

Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII

KEYWORDS: Mirrors, Free electron lasers, Wavefronts, Wavefront sensors, Diffraction, Polymethylmethacrylate, Point spread functions, Computer simulations, Atomic force microscopy, X-ray optics

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PROCEEDINGS ARTICLE | October 19, 2012

An active optics system for EUV/soft x-ray beam shaping

Proc. SPIE. 8503, Adaptive X-Ray Optics II

KEYWORDS: Mirrors, Actuators, Free electron lasers, Active optics, Beam shaping, Interferometers, X-rays, Metrology, Wavelength division multiplexing, Resistance

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PROCEEDINGS ARTICLE | October 15, 2012

Cross comparison of surface slope and height optical metrology with a super-polished plane Si mirror

Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV

KEYWORDS: Mirrors, Metrology, X-rays, Optical metrology, X-ray optics, Free electron lasers, Silicon, Light sources, Interferometers, Calibration

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PROCEEDINGS ARTICLE | October 15, 2012

The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results

Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

KEYWORDS: Free electron lasers, Diagnostics, Mirrors, Electron beams, Photon transport, YAG lasers, Spectroscopy, Beam propagation method, Modulators, Modulation

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PROCEEDINGS ARTICLE | September 28, 2011

Characterization of the FERMI@Elettra's on-line photon energy spectrometer

Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI

KEYWORDS: Spectroscopy, Diffraction gratings, Free electron lasers, Diffraction, Metrology, Spatial frequencies, Diagnostics, X-rays, Energy efficiency, Sensors

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PROCEEDINGS ARTICLE | May 21, 2011

Delay systems and phase retarders based on multilayers coated mirrors for FEL beam manipulation

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Mirrors, Free electron lasers, Multilayers, Beam splitters, Wave plates, Polarization, Optical components, Polarizers, Phase shifts, Light

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PROCEEDINGS ARTICLE | May 21, 2011

Multilayer mirrors for FERMIatELETTRA beam transport system

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Free electron lasers, Reflectivity, Multilayers, Optical coatings, Extreme ultraviolet, Mirrors, Iridium, X-ray optics, Monochromators, Wavefronts

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PROCEEDINGS ARTICLE | May 21, 2011

First results from the commissioning of the FERMI@Elettra free electron laser by means of the Photon Analysis Delivery and Reduction System (PADReS)

Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

KEYWORDS: Free electron lasers, Spectroscopy, Diagnostics, Safety, Beam propagation method, Photon transport, Photonics systems, Pulsed laser operation, Mirrors, Visible radiation

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PROCEEDINGS ARTICLE | May 19, 2011

Probing matter under extreme conditions at Fermi@Elettra: the TIMEX beamline

Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III

KEYWORDS: Free electron lasers, Mirrors, Electrons, Absorption, Aluminum, X-rays, Sensors, Condensed matter, Ultrafast phenomena, Optical filters

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SPIE Conference Volume | May 18, 2011

Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

PROCEEDINGS ARTICLE | September 9, 2009

A fixed included angle monochromator for the 4th generation light source at FERMI@Elettra

Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV

KEYWORDS: Free electron lasers, Monochromators, Mirrors, Diffraction, Wavefronts, Diffraction gratings, Spherical lenses, Light sources, Optical design, Manufacturing

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PROCEEDINGS ARTICLE | May 18, 2009

The FERMI@Elettra FEL photon transport system

Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II

KEYWORDS: Mirrors, Free electron lasers, Wavefronts, Multilayers, Reflectivity, Monochromators, Safety, Camera shutters, Photon transport, Coating

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PROCEEDINGS ARTICLE | September 17, 2005

On the choice of a metrological instrument for synchrotron radiation optics

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, Interferometers, Metrology, Spherical lenses, Optical spheres, Optical components, Synchrotron radiation, Wavefronts, Ultraviolet radiation, Photons

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PROCEEDINGS ARTICLE | September 17, 2005

First report on a European round robin for slope measuring profilers

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, Metrology, Error analysis, Sensors, Spherical lenses, Head, Nano opto mechanical systems, X-ray optics, Calibration, Interferometers

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PROCEEDINGS ARTICLE | September 17, 2005

A second optic head for the ELETTRA long trace profiler

Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics

KEYWORDS: Mirrors, Head, Sensors, Interferometers, Charge-coupled devices, Calibration, Optical spheres, Neodymium, Beam splitters, Ocean optics

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PROCEEDINGS ARTICLE | September 10, 2005

A plane grating with single-layer coating for the sub-nanometer wavelength range

Proc. SPIE. 5918, Laser-Generated, Synchrotron, and Other Laboratory X-Ray and EUV Sources, Optics, and Applications II

KEYWORDS: Diffraction gratings, Silicon, Etching, Gold, Monochromators, Mirrors, Diffraction, Microscopes, Coating, X-rays

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PROCEEDINGS ARTICLE | December 24, 2002

Kirkpatrick-Baez elliptical bendable mirrors at the nanospectroscopy beamline: metrological results and x-ray performance

Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II

KEYWORDS: Mirrors, X-rays, Nanospectroscopy, Metrology, Actuators, Microscopes, Polishing, Grazing incidence, Monochromators, X-ray optics

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PROCEEDINGS ARTICLE | December 24, 2002

Temperature-dependence perturbations on LTP measurements

Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II

KEYWORDS: Mirrors, Head, Phase modulation, Temperature metrology, Metrology, Thermography, Control systems, Synchrotron radiation, Turbulence, Optical components

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PROCEEDINGS ARTICLE | December 20, 2001

Multipurpose experimental station for soft x-ray microscopy on BACH beamline at Elettra

Proc. SPIE. 4506, Soft X-Ray and EUV Imaging Systems II

KEYWORDS: Sensors, X-rays, Spectral resolution, Microscopes, X-ray microscopy, Monochromators, Mirrors, Signal detection, Polarization, Absorption

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PROCEEDINGS ARTICLE | December 20, 2001

ComIXS: a compact inelastic x-ray spectrometer

Proc. SPIE. 4506, Soft X-Ray and EUV Imaging Systems II

KEYWORDS: Photons, Spectral resolution, Sensors, Spatial resolution, Charge-coupled devices, Spectroscopy, X-rays, Diffraction gratings, Spherical lenses, Luminescence

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Soft x-ray emission spectroscopy is a well established technique, which has seen increased interest in recent years due to the development of high brilliance synchrotron radiation facilities. Emission spectra are obtained when a hole is created by impinging photons, and an electron from the valence band decays into the core hole emitting its excess energy radiatively. The fluorescence yield is intrinsically low in the range of soft x-rays, usually less than about 0.5%, since the most probable decay channels are radiationless channels like Coster Kronig and Auger processes. Emission is over all space, but only a restricted solid angle can be collected and this further reduces the efficiency of the instrumentation. Moreover, the emitted photons must be energy selected, and this involves the use of soft x-ray monochromators with good resolving power. We designed a photon spectrometer to be located in the experimental chamber of one of ELETTRA's beamlines (BACH) to perform inelastic X-ray scattering measurement in the energy range 20-1200 eV with relatively high resolving power (above 2000 in most of the range). The spectrometer is based on two interchangeable mechanically ruled spherical VLS gratings with blaze profile of the grooves. The diffracted photons are collected by a back illuminated CCD of 1300X1340 pixels, each of 20X20 micrometers ² dimension. The two interchangeable gratings are inserted in or removed from the beam by manual translation and are kept fixed during the measurement. The energy scan (or selection) is made by a mono-dimensional translation of the CCD. To cover the whole energy range, including the zero order light, only a small movement (about 7 cm of linear translation) of the detector is necessary. No detector rotation or bi-dimensional displacement is needed. Since the size of the CCD is quite large, it is possible to collect, in a single shot, a very large photon energy window, about 20-30% of the full energy range of each grating. The optical layout and the expected performances are reported.

PROCEEDINGS ARTICLE | November 14, 2001

Synchrotron radiation optics: quality demands and technical achievability

Proc. SPIE. 4501, X-Ray Mirrors, Crystals, and Multilayers

KEYWORDS: Mirrors, Metrology, Synchrotron radiation, Surface roughness, Optical testing, Spherical lenses, Interferometers, Optical components, Error analysis, Optics manufacturing

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PROCEEDINGS ARTICLE | January 5, 2001

Study of clamping-induced deformations on SR optics by means of LTP

Proc. SPIE. 4145, Advances in X-Ray Optics

KEYWORDS: Mirrors, Monochromators, Copper, Spectral resolution, Optics manufacturing, Spherical lenses, Optical components, X-ray optics, Synchrotron radiation, Distortion

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PROCEEDINGS ARTICLE | November 8, 2000

High-precision measurements of the groove density of diffraction gratings

Proc. SPIE. 4146, Soft X-Ray and EUV Imaging Systems

KEYWORDS: Diffraction gratings, Mirrors, X-rays, Diffraction, Synchrotron radiation, Sensors, Spherical lenses, Fourier transforms, Detector arrays, Head

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PROCEEDINGS ARTICLE | November 8, 2000

Optical layout of BACH: a beamline for advanced dichroism at Elettra

Proc. SPIE. 4146, Soft X-Ray and EUV Imaging Systems

KEYWORDS: Mirrors, Monochromators, Spectral resolution, Spherical lenses, Optical components, Gold, X-rays, Silicon, Monochromatic aberrations, Scattering

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PROCEEDINGS ARTICLE | November 23, 1999

Microfocusing VLS-grating-based beamline for advanced microscopy

Proc. SPIE. 3767, EUV, X-Ray, and Neutron Optics and Sources

KEYWORDS: Mirrors, Monochromators, Microscopes, Spherical lenses, Spectral resolution, Microscopy, Grazing incidence, Solids, X-ray optics, X-rays

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PROCEEDINGS ARTICLE | September 6, 1999

Metrological challenges of synchrotron radiation optics

Proc. SPIE. 3739, Optical Fabrication and Testing

KEYWORDS: Mirrors, Interferometers, Metrology, Synchrotron radiation, Laser induced plasma spectroscopy, Spherical lenses, X-ray optics, Calibration, Grazing incidence, Photons

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PROCEEDINGS ARTICLE | September 24, 1998

Design and comparison of two photon spectrometers for soft x-ray emission spectroscopy

Proc. SPIE. 3450, Theory and Practice of Surface-Relief Diffraction Gratings: Synchrotron and Other Applications

KEYWORDS: Sensors, Spectral resolution, Spectrometers, X-rays, Spherical lenses, Emission spectroscopy, Optical design, Energy efficiency, Monochromators, Scattering

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