Dr. Kai Tiedtke
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Publications (18)

PROCEEDINGS ARTICLE | June 21, 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

PROCEEDINGS ARTICLE | June 16, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Photodetectors, X-rays, Diagnostics, X-ray lasers, Free electron lasers, Spectroscopes, Current controlled current source

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Reflection, Photons, Molecules, Diffusion, Polymerization, Palladium, Synchrotrons, Analytical research, Probability theory, Crystallography

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Carbon, Mirrors, X-ray optics, Sputter deposition, X-rays, Nickel, Silicon, Coating, Reflectivity, Free electron lasers

SPIE Conference Volume | May 20, 2013

PROCEEDINGS ARTICLE | May 3, 2013
Proc. SPIE. 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation
KEYWORDS: Mirrors, Chemical species, Spectroscopy, X-rays, Ions, Xenon, Ionization, Extreme ultraviolet, Free electron lasers, Multiphoton processes

Showing 5 of 18 publications
Conference Committee Involvement (5)
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
18 August 2014 | San Diego, California, United States
Advances in X-ray Free-Electron Lasers II: Instrumentation
17 April 2013 | Prague, Czech Republic
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
14 August 2012 | San Diego, California, United States
Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics and Instrumentation
20 April 2011 | Prague, Czech Republic
Advances in X-Ray/EUV Optics and Components III
11 August 2008 | San Diego, California, United States
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