PROCEEDINGS VOLUME 6762
OPTICS EAST | 9-12 SEPTEMBER 2007
Two- and Three-Dimensional Methods for Inspection and Metrology V
IN THIS VOLUME

0 Sessions, 17 Papers, 0 Presentations
Front Matter  (1)
Proceedings Volume 6762 is from: Logo
OPTICS EAST
9-12 September 2007
Boston, MA, United States
Front Matter
Proc. SPIE 6762, Front Matter: Volume 6762, 676201 (22 October 2007); doi: 10.1117/12.781776
3D and Machine Vision Methods
Proc. SPIE 6762, Smooth 3D edge detection in scarfed composite surfaces, 676202 (26 September 2007); doi: 10.1117/12.732136
Proc. SPIE 6762, Depth and focused image recovery from defocused images for cameras operating in macro mode, 676203 (26 September 2007); doi: 10.1117/12.732252
Proc. SPIE 6762, Absolute phase retrieval for 3D shape measurement by Fourier transform method, 676204 (26 September 2007); doi: 10.1117/12.747627
Proc. SPIE 6762, Single image depth edges classification using a red, green, and blue light, 676205 (10 October 2007); doi: 10.1117/12.735745
3D Methods and Data Merging
Proc. SPIE 6762, Multiple views merging from different cameras in fringe-projection based phase-shifting method, 676207 (10 October 2007); doi: 10.1117/12.735040
Proc. SPIE 6762, The concept of virtual landmarks in 3D multi-view fringe projection, 676208 (11 October 2007); doi: 10.1117/12.735706
Proc. SPIE 6762, 3D data merging using Holoimage, 676209 (26 September 2007); doi: 10.1117/12.741459
Proc. SPIE 6762, Improved feature descriptors for 3D surface matching, 67620A (10 October 2007); doi: 10.1117/12.753263
3D Applications
Proc. SPIE 6762, Applications of a MEMS scanner to profile measurement, 67620B (10 October 2007); doi: 10.1117/12.733048
Proc. SPIE 6762, Development of a compact inner profile measuring instrument, 67620D (10 October 2007); doi: 10.1117/12.733215
Proc. SPIE 6762, Intraoral 3D scanner, 67620E (10 October 2007); doi: 10.1117/12.735700
Proc. SPIE 6762, Hybrid interferometric structured light method for surface mapping, 67620F (10 October 2007); doi: 10.1117/12.735676
System Optimization Methods
Proc. SPIE 6762, Network-based production quality control, 67620G (10 October 2007); doi: 10.1117/12.732503
Proc. SPIE 6762, Optimized scattering compensation for time-of-flight camera, 67620H (10 October 2007); doi: 10.1117/12.733961
Proc. SPIE 6762, A ray tracing approach to inverse pattern profilometry, 67620I (10 October 2007); doi: 10.1117/12.733944
Poster Session
Proc. SPIE 6762, Mobile shearography in applications, 67620K (10 October 2007); doi: 10.1117/12.735483
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