Dr. Amparo Vivo
Engineer at ESRF - The European Synchrotron
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, 3D modeling, X-rays, Synchrotrons, X-ray optics, Nano opto mechanical systems, 3D metrology, Environmental sensing, Metrology, Interferometry

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X
KEYWORDS: Mirrors, Multilayers, X-rays, Reflectivity, Diffraction, Sputter deposition, Optical coatings, X-ray optics, Nanoimaging, Optical simulations

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Mirrors, Finite element methods, X-rays, Polishing, Optics manufacturing, X-ray optics, Manufacturing, Multilayers, Silicon, Gold

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Silicon, Reflection, X-rays, Multilayers, Visibility, Surface roughness, Interfaces, Spatial coherence, Coherence (optics), Reflectivity

PROCEEDINGS ARTICLE | August 27, 2010
Proc. SPIE. 7801, Advances in Metrology for X-Ray and EUV Optics III
KEYWORDS: Mirrors, Fizeau interferometers, X-rays, Interferometry, Optics manufacturing, Spherical lenses, Metrology, Objectives, Optical spheres, X-ray optics

PROCEEDINGS ARTICLE | September 27, 2007
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Mirrors, Spherical lenses, Metrology, X-rays, Error analysis, Silicon, Silicon carbide, Interferometry, Optical components, Sensors

Showing 5 of 18 publications
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
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