Dr. Amparo Vivo
Engineer at ESRF - The European Synchrotron
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, X-ray optics, Metrology, Nano opto mechanical systems, X-rays, Interferometry, 3D modeling, 3D metrology, Synchrotrons, Environmental sensing

PROCEEDINGS ARTICLE | August 26, 2015
Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X
KEYWORDS: Diffraction, Mirrors, Multilayers, X-ray optics, Nanoimaging, Sputter deposition, X-rays, Optical coatings, Reflectivity, Optical simulations

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Gold, Mirrors, Multilayers, X-ray optics, Polishing, X-rays, Silicon, Manufacturing, Finite element methods, Optics manufacturing

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Multilayers, Coherence (optics), Reflection, X-rays, Interfaces, Silicon, Reflectivity, Surface roughness, Spatial coherence, Visibility

PROCEEDINGS ARTICLE | August 27, 2010
Proc. SPIE. 7801, Advances in Metrology for X-Ray and EUV Optics III
KEYWORDS: Mirrors, X-ray optics, Metrology, Optical spheres, X-rays, Interferometry, Objectives, Spherical lenses, Optics manufacturing, Fizeau interferometers

PROCEEDINGS ARTICLE | September 27, 2007
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Optical components, Mirrors, Metrology, Sensors, Error analysis, X-rays, Silicon, Interferometry, Silicon carbide, Spherical lenses

Showing 5 of 18 publications
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
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