Dr. Victor Moroz
Scientist at Synopsys Inc
SPIE Involvement:
Publications (6)

Proceedings Article | 22 February 2021 Presentation + Paper
Ashish Pal, Plamen Asenov, El Mehdi Bazizi, Jaehyun Lee, Benjamin Colombeau, Sanjay Natarajan, Blessy Alexander, Buvna Ayyagari-Sangmalli, Victor Moroz, Xi-Wei Lin
Proceedings Volume 11614, 116140G (2021) https://doi.org/10.1117/12.2583923
KEYWORDS: Systems modeling, Fin field effect transistors, Logic, TCAD, Standards development, Signal generators, Resistance, Metals, Materials processing, Field effect transistors

Proceedings Article | 23 March 2020 Presentation + Paper
Proceedings Volume 11328, 113280C (2020) https://doi.org/10.1117/12.2554025
KEYWORDS: Fin field effect transistors, Standards development, Transistors, Clocks, Device simulation, TCAD, Logic, Design for manufacturability

Proceedings Article | 23 March 2020 Presentation + Paper
Proceedings Volume 11328, 113280Y (2020) https://doi.org/10.1117/12.2553656
KEYWORDS: Device simulation, Optical lithography, Silicon, Semiconducting wafers, Process modeling, Visualization, Lithography, Design for manufacturing

Proceedings Article | 21 March 2012 Paper
Victor Moroz, Lars Bomholt
Proceedings Volume 8323, 83231Z (2012) https://doi.org/10.1117/12.916231
KEYWORDS: Line edge roughness, Epitaxy, Lithography, Crystals, Monte Carlo methods, Line width roughness, Etching, Silicon, Transistors

Proceedings Article | 13 March 2009 Paper
Victor Moroz, Munkang Choi, Xi-Wei Lin
Proceedings Volume 7275, 72751B (2009) https://doi.org/10.1117/12.814369
KEYWORDS: Transistors, Ions, Shape analysis, Solids, Channel projecting optics, Device simulation, Photomasks, TCAD, Optical proximity correction, Line edge roughness

Showing 5 of 6 publications
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