PROCEEDINGS VOLUME 8036
SPIE DEFENSE, SECURITY, AND SENSING | 25-29 APRIL 2011
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Proceedings Volume 8036 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
25-29 April 2011
Orlando, Florida, United States
Front Matter
Proc. SPIE 8036, Front Matter: Volume 8036, 803601 (30 June 2011); doi: 10.1117/12.901403
Keynote Session
Proc. SPIE 8036, Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape, 803602 (1 June 2011); doi: 10.1117/12.881040
Forensics
Proc. SPIE 8036, Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary, 803604 (1 June 2011); doi: 10.1117/12.883409
Proc. SPIE 8036, Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samples, 803605 (30 June 2011); doi: 10.1117/12.884506
Proc. SPIE 8036, Scientific working group on gunshot residue (SWGGSR): a progress report, 803606 (8 June 2011); doi: 10.1117/12.887503
Proc. SPIE 8036, Characterization and source identification of fugitive dusts by light and electron microscopy, 803607 (9 June 2011); doi: 10.1117/12.885022
Proc. SPIE 8036, Application possibilities of several modern methods of microscopy and microanalysis in forensic science field, 803608 (11 May 2011); doi: 10.1117/12.887850
Advancements in Scanning Electron Microscopy II
Proc. SPIE 8036, Advanced image composition with intra-frame drift correction, 80360D (11 May 2011); doi: 10.1117/12.887183
Proc. SPIE 8036, The characterization of nanoparticles using analytical electron microscopy, 80360E (1 June 2011); doi: 10.1117/12.885115
Proc. SPIE 8036, Transmission electron microscopy of electrospun GaN nanofibers, 80360F (1 June 2011); doi: 10.1117/12.885543
Proc. SPIE 8036, Study of LCE nanocomposites through electron microscopy, 80360G (9 June 2011); doi: 10.1117/12.885539
Proc. SPIE 8036, Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosion, 80360H (1 June 2011); doi: 10.1117/12.883231
Proc. SPIE 8036, Nanodispersion, nonlinear image filtering, and materials classification, 80360I (7 June 2011); doi: 10.1117/12.883232
Advancements in Helium Ion Microscopy
Proc. SPIE 8036, Investigation of cellular interactions of nanoparticles by helium ion microscopy, 80360K (1 June 2011); doi: 10.1117/12.887141
Proc. SPIE 8036, Creating nanohole arrays with the helium ion microscope, 80360M (1 June 2011); doi: 10.1117/12.887497
Proc. SPIE 8036, Secondary electron emission spectra and energy selective imaging in helium ion microscope, 80360O (1 June 2011); doi: 10.1117/12.886347
Advances in Scanned Probe Microscopies I
Proc. SPIE 8036, A metrological scanning probe microscope based on a quartz tuning fork detector, 80360P (1 June 2011); doi: 10.1117/12.884567
Proc. SPIE 8036, Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM, 80360Q (1 June 2011); doi: 10.1117/12.883818
Proc. SPIE 8036, Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stage, 80360R (1 June 2011); doi: 10.1117/12.883334
Proc. SPIE 8036, Traceable calibration of a critical dimension atomic force microscope, 80360S (1 June 2011); doi: 10.1117/12.887290
Advances in Scanned Probe Microscopies II
Proc. SPIE 8036, Particle number density gradient samples for nanoparticle metrology with atomic force microscopy, 80360T (1 June 2011); doi: 10.1117/12.884566
Proc. SPIE 8036, Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ, 80360U (1 June 2011); doi: 10.1117/12.883851
Proc. SPIE 8036, New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy, 80360V (10 June 2011); doi: 10.1117/12.884657
Advances in Optical Microscopy
Proc. SPIE 8036, Through-focus scanning optical microscopy, 803610 (1 June 2011); doi: 10.1117/12.884706
Proc. SPIE 8036, Dispersion free all reflective confocal microscope objective, 803612 (1 June 2011); doi: 10.1117/12.883385
Proc. SPIE 8036, Use of fluorescence and scanning electron microscopy as tools in teaching biology, 803613 (1 June 2011); doi: 10.1117/12.883925
Particle Beam Interaction Workshop
Proc. SPIE 8036, 3D-measurement using a scanning electron microscope with four Everhart-Thornley detectors, 803615 (1 June 2011); doi: 10.1117/12.883884
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