Prof. Xi Hou
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (29)

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Mathematical modeling, Mirrors, Polishing, Data modeling, Spatial frequencies, Scattering, Error analysis, Optics manufacturing, Zerodur, Surface finishing

PROCEEDINGS ARTICLE | November 3, 2016
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Photovoltaics, X-ray optics, Polishing, Spatial frequencies, Scattering, Error analysis, Aspheric lenses, Grazing incidence, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Diffraction, Mirrors, Fringe analysis, Optical spheres, Interferometers, Wavefronts, Optical testing, Computer generated holography, Aspheric optics, Aspheric lenses

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Zemax, Mirrors, Eye, Holograms, Optical spheres, Error analysis, Optical testing, Computer generated holography, Aspheric lenses, Eye models

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Photovoltaics, Monochromatic aberrations, Statistical analysis, Optical spheres, Interferometers, Calibration, Interferometry, Wavefronts, Computer simulations, Optical testing

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Mirrors, X-ray optics, Single point diamond turning, Polishing, X-rays, Nickel, X-ray telescopes, Radium, Magnetorheological finishing, Surface finishing

Showing 5 of 29 publications
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