PROCEEDINGS VOLUME 5880
OPTICS AND PHOTONICS 2005 | 31 JULY - 4 AUGUST 2005
Optical Diagnostics
OPTICS AND PHOTONICS 2005
31 July - 4 August 2005
San Diego, California, United States
Image Processing and 3D Imaging Methods
Proc. SPIE 5880, AM Multipurpose High-Resolution Imaging Topological Radar (ITR): reverse engineering and artworks monitoring and restoration, 588001 (18 August 2005); doi: 10.1117/12.618641
Proc. SPIE 5880, Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern, 588003 (19 August 2005); doi: 10.1117/12.616199
Proc. SPIE 5880, Development of fringe analysis method for image in ESPI using single sheet of specklegram, 588004 (19 August 2005); doi: 10.1117/12.615846
Proc. SPIE 5880, Supercomputing in compression of temporal fringe pattern analysis, 588005 (18 August 2005); doi: 10.1117/12.614710
Proc. SPIE 5880, On nonlinear wave dissipation in polymers, 588006 (18 August 2005); doi: 10.1117/12.616592
Non-destructive Evaluation
Proc. SPIE 5880, Light scattering diagnostics for metal fatigue detection and life estimation, 588007 (18 August 2005); doi: 10.1117/12.617980
Proc. SPIE 5880, Measurement of nugget size of spot weld by digital shearography, 588008 (18 August 2005); doi: 10.1117/12.617560
Proc. SPIE 5880, Infrared on-orbit inspection of shuttle orbiter reinforced carbon-carbon using solar heating, 588009 (18 August 2005); doi: 10.1117/12.615332
Proc. SPIE 5880, Evaluation of microbolometer-based thermography for gossamer space structures, 58800A (18 August 2005); doi: 10.1117/12.618069
Proc. SPIE 5880, Remote optical measurement of thermal and mechanical properties of engineering structures, 58800B (18 August 2005); doi: 10.1117/12.613957
Solid Surface Measurements
Proc. SPIE 5880, Strain measurement of a mouse bone by 3D-electronic speckle pattern interferometry (3D-ESPI), 58800C (18 August 2005); doi: 10.1117/12.617670
Proc. SPIE 5880, A second-generation liquid crystal phase-shifting point-diffraction interferometer employing structured substrates, 58800D (18 August 2005); doi: 10.1117/12.617631
Proc. SPIE 5880, Development of a non-contacting extensometer using digital speckle correlation, 58800E (18 August 2005); doi: 10.1117/12.618290
Proc. SPIE 5880, Resolution increase by aperture synthesis in digital holography, 58800F (18 August 2005); doi: 10.1117/12.617010
Proc. SPIE 5880, Deflection distribution measurement of steel structure using digital image correlation, 58800G (18 August 2005); doi: 10.1117/12.614364
Proc. SPIE 5880, Synchronized low coherence interferometry for in-situ and ex-situ metrology for semiconductor manufacturing, 58800H (18 August 2005); doi: 10.1117/12.615254
Proc. SPIE 5880, Wet/dry film thickness measurement of paint by absorption spectroscopy with acousto-optic tunable filter spectrometer, 58800I (19 August 2005); doi: 10.1117/12.617312
Combustion Diagnostics
Proc. SPIE 5880, Dynamic detection of species concentration and distribution in pre-combustion gases by laser spectroscopy of infrared absorption, 58800J (24 August 2005); doi: 10.1117/12.618205
Proc. SPIE 5880, Molecular Rayleigh scattering diagnostic for measurement of high frequency temperature fluctuations, 58800K (18 August 2005); doi: 10.1117/12.615415
Proc. SPIE 5880, Visualization of hydrogen flame by differential imaging in the ultraviolet region, 58800L (18 August 2005); doi: 10.1117/12.616247
Proc. SPIE 5880, Optical diagnosis of atmospheric pressure nonthermal plasma for pollution control, 58800M (18 August 2005); doi: 10.1117/12.615634
Proc. SPIE 5880, Combined multispecies PLIF diagnostics with kHz rate in a technical fuel mixing system relevant for combustion processes, 58800N (18 August 2005); doi: 10.1117/12.616769
Proc. SPIE 5880, Cavity ringdown spectroscopy for soot measurement in diesel exhaust, 58800O (18 August 2005); doi: 10.1117/12.614555
Proc. SPIE 5880, Liquid/vapor visualization of common rail diesel sprays in different ambient conditions with visible and UV laser light scattering and PLIF, 58800P (18 August 2005); doi: 10.1117/12.618728
Proc. SPIE 5880, Optical investigation of heat release and NOx production in combustion, 58800Q (18 August 2005); doi: 10.1117/12.619230
Optical Property Measurements and Standards
Proc. SPIE 5880, New NIST reference goniospectrometer, 58800T (24 August 2005); doi: 10.1117/12.621516
Proc. SPIE 5880, Developments in the realization of diffuse reflectance scales at NPL, 58800V (18 August 2005); doi: 10.1117/12.620268
Proc. SPIE 5880, Emissivities of ceramic materials for for high temperature processes, 58800W (18 August 2005); doi: 10.1117/12.624512
Proc. SPIE 5880, Method for absolute measurements of reflectance and transmittance of specular samples with STAR GEM, 58800X (18 August 2005); doi: 10.1117/12.624858
Fluid Measurements
Proc. SPIE 5880, Real time measurement of the refractive index of petroleum samples in a wide temperature range, 58800Y (18 August 2005); doi: 10.1117/12.614460
Proc. SPIE 5880, The effect of particle image blur on the correlation map and velocity measurement in PIV, 588010 (24 August 2005); doi: 10.1117/12.616572
Proc. SPIE 5880, Single camera three component planar velocity measurements, using two frequency Planar Doppler Velocimetry (2ν-PDV), 588011 (18 August 2005); doi: 10.1117/12.614380
Posters-Wednesday
Proc. SPIE 5880, Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis, 588013 (19 August 2005); doi: 10.1117/12.616232
Proc. SPIE 5880, 3D-measuring-modeling-system based on digital camera and PC to be applied to the wide area of industrial measurement, 588015 (18 August 2005); doi: 10.1117/12.618253
Proc. SPIE 5880, A friction induced impulse noise detection of a PDP TV by using the double pulse ESPI, 588016 (18 August 2005); doi: 10.1117/12.613798
Proc. SPIE 5880, Digital interferometry of symmetrical flows with inner shocks, 588018 (18 August 2005); doi: 10.1117/12.626822
Proc. SPIE 5880, Linking fluorescence spectroscopy to the scale of spectral sensitivity: the BAM reference fluorometer, 588019 (18 August 2005); doi: 10.1117/12.628912
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