Dr. Kyle Braam
Engineer & Design at Synopsys Inc
SPIE Involvement:
Publications (8)

Proceedings Article | 30 April 2023 Presentation
Proceedings Volume 12495, 124951E (2023) https://doi.org/10.1117/12.2657808
KEYWORDS: Machine learning, Lithography, Photomasks, Source mask optimization, Numerical analysis, Convolutional neural networks, Computational lithography

Proceedings Article | 28 April 2023 Presentation + Paper
Jun Zhu, Brad Falch, Kyle Braam, Petrisor Panaite, Ming Su, C. Jay Lee
Proceedings Volume 12495, 124951B (2023) https://doi.org/10.1117/12.2662024
KEYWORDS: Education and training, Design and modelling, Statistical modeling, Machine learning, Reflection, Principal component analysis, Feature extraction, Transform theory, Statistical analysis, Data modeling

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12495, 1249503 (2023) https://doi.org/10.1117/12.2657538
KEYWORDS: Design and modelling, Optical proximity correction, Semiconducting wafers, Lithography, Manufacturing, Visualization, Reticles, Printing, 193nm lithography, Source mask optimization

Proceedings Article | 22 March 2021 Presentation + Paper
Proceedings Volume 11613, 116130P (2021) https://doi.org/10.1117/12.2587107
KEYWORDS: Machine learning, Visualization, Optical proximity correction, Neural networks

Proceedings Article | 23 March 2020 Presentation + Paper
Proceedings Volume 11328, 1132806 (2020) https://doi.org/10.1117/12.2557847
KEYWORDS: Photomasks, Lithography, Optical proximity correction, Bridges, Data analysis, Semiconducting wafers, Resolution enhancement technologies, SRAF

Showing 5 of 8 publications
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