Dr. Lei Huang
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (17)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Metrology, Mirrors, Optical alignment, Wavefront sensors, Device simulation, Synchrotrons, X-rays, Synchrotron radiation, Wavefront aberrations, In situ metrology

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Deflectometry, 3D metrology, Phase measurement, Mathematical modeling, Optical metrology, Ray tracing, 3D modeling, Nonlinear optics, Cameras, 3D acquisition

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Deformable mirrors, X-rays, Mirrors, Inspection, Metrology, Actuators, Silicon, X-ray optics, Adaptive optics, Feedback loops

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: X-ray optics, Optical metrology, Mirrors, Metrology, Polishing, Ion beams, Optical components, Surface finishing, Optics manufacturing, Spatial frequencies

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: X-rays, Actuators, Deformable mirrors, Metrology, Standards development, Mirrors, Mirrors, Inspection, Time metrology, X-ray optics, Adaptive optics

SPIE Journal Paper | August 5, 2015
OE Vol. 54 Issue 08
KEYWORDS: Mirrors, Calibration, Cameras, X-ray optics, X-rays, Optical testing, Metrology, Distortion, Aspheric lenses, Monochromatic aberrations

Showing 5 of 17 publications
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